2014
DOI: 10.7567/apex.7.025501
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Synthesis of α-SiC from tetramethylsilane by chemical vapor deposition at high temperature

Abstract: Tetramethylsilane (TMS) is a common liquid-phase precursor that is used in the synthesis of β-SiC by chemical vapor deposition (CVD). At temperatures above 1500 °C, however, it has been shown that C is also formed together with SiC. In this study, based on thermodynamic modeling, we report on the successful synthesis of single-phase SiC with no evidence of the inclusion of C from TMS through CVD at temperatures over 1900 °C. X-ray diffraction data showed that α-SiC phases are formed at temperatures over 2000 °… Show more

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Cited by 14 publications
(5 citation statements)
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“…The inserted image of Figure a is an optical microscopic image showing the particles of the green deposits. In our previous study, while large amounts of 3C-SiC were formed at temperatures lower than 1800 °C, α-SiC became abundant with increasing temperatures . In the processing conditions of the current study, the deposits were characterized as a mixture of 4H-, 6H-, and 15R-SiC by XRD, as shown in Figure b, which was consistent with results reported in a previous study .…”
Section: Results and Discussionsupporting
confidence: 91%
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“…The inserted image of Figure a is an optical microscopic image showing the particles of the green deposits. In our previous study, while large amounts of 3C-SiC were formed at temperatures lower than 1800 °C, α-SiC became abundant with increasing temperatures . In the processing conditions of the current study, the deposits were characterized as a mixture of 4H-, 6H-, and 15R-SiC by XRD, as shown in Figure b, which was consistent with results reported in a previous study .…”
Section: Results and Discussionsupporting
confidence: 91%
“…In our previous study, while large amounts of 3C-SiC were formed at temperatures lower than 1800 °C, α-SiC became abundant with increasing temperatures . In the processing conditions of the current study, the deposits were characterized as a mixture of 4H-, 6H-, and 15R-SiC by XRD, as shown in Figure b, which was consistent with results reported in a previous study . Compared to XRD, micro-Raman spectroscopy provides a much better spatial resolution of ∼1 μm, which allows individual particles to be characterized.…”
Section: Results and Discussionsupporting
confidence: 90%
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“…The induction heating was adjusted in the HTCVD process to control the growth temperature with graphite susceptors. More detailed information about the HTCVD is given in our previous reports 33 , 37 , 38 , 47 . TMS (99.9%) (Sigma-Aldrich Co.) and H 2 (99.999%) were used as a source precursor and a carrier gas, respectively.…”
Section: Methodsmentioning
confidence: 99%
“…In a HTCVD process, mass production is possible because the sources, such as the gas species, are continuously supplied to the HTCVD chamber during the growth process. Moreover, the ratio of C to Si can be easily controlled via the flow of the source and carrier gases and the design of susceptors 33 , 37 , 38 . This aspect is important because controlling the Si/C ratio determines whether SiC single crystals can be obtained without excess carbon.…”
Section: Introductionmentioning
confidence: 99%