System-level BIT false alarm reducing technology based on fault propagation analysis of complex system

Zhao, Zhiao; Qiu, Jing; Liu, Guanjun; Li, Kehong; Chun, Jing

doi:10.1109/icqr2mse.2012.6246325

2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering 2012

DOI: 10.1109/icqr2mse.2012.6246325

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System-level BIT false alarm reducing technology based on fault propagation analysis of complex system

Zhiao Zhao

Jing Qiu

Guanjun Liu

et al.

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“…Some conventional false alarm reduction methods are taken in practice, including repeated tests or voting tests [16], [17], propagation analysis [18], [19], signal filtering [20], [21], and so on. They merely adopt intuitive and simple logics, and process the raw BIT output in a rather easy way.…”

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Multi-State Adaptive BIT False Alarm Reduction Under Degradation Process

Cui

Shi

Wang

2015

IEEE Trans. Instrum. Meas.

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Built-in tests (BITs) are widely used in mechanical systems to detect and diagnose a fault, whereas the BIT false alarms bring much trouble for precise fault diagnosis and logistics/maintenance arrangement. The false alarm phenomenon is related to the degradation over time, and the false alarm evolution process can be typically divided into three stages. This paper proposes a condition-based multistage false alarm detection and reduction method for mechanical systems. The stages are clarified according to the degradation level and the false alarm severity. The dividing boundaries of the stages are optimized using soft margin one-versus-rest support vector machine (SVM) classifiers. The associated intermediate stage is the intense period of false alarms, and the dynamic Bayesian network inference model is developed to satisfy the requirements of accurate false alarm diagnosis. To achieve the goal of false alarm suppression, the top-level BIT outputs are updated with the original BIT alarms and the identified probable states. Finally, the proposed approach is demonstrated in the application study of a milling machine and the well-round experimental results are analyzed. Index Terms-Built-in test (BIT), dynamic Bayesian network (DBN), false alarm, mechanical system, support vector machine (SVM).

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Multi-State Adaptive BIT False Alarm Reduction Under Degradation Process

Cui

Shi

Wang

2015

IEEE Trans. Instrum. Meas.

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Integrated built-in-test false and missed alarms reduction based on forward infinite impulse response & recurrent finite impulse response dynamic neural networks

Cui

Shi

Wang

2017

Mechanical Systems and Signal Processing

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System-level BIT false alarm reducing technology based on fault propagation analysis of complex system

Cited by 2 publications

References 4 publications

Multi-State Adaptive BIT False Alarm Reduction Under Degradation Process

Multi-State Adaptive BIT False Alarm Reduction Under Degradation Process

Integrated built-in-test false and missed alarms reduction based on forward infinite impulse response & recurrent finite impulse response dynamic neural networks

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