2006
DOI: 10.1364/ao.45.001743
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Systematic modeling study of channel waveguide fabrication by thermal silver ion exchange

Abstract: A systematic study of thermal silver ion exchange used for the fabrication of optical channel waveguides is reported in a single-alkali glass. The diffusion equilibrium and diffusion dynamics are experimentally studied, and the concentration-dependent diffusion coefficients are determined. The relationship between the fabrication conditions, i.e., time, temperature, and melt concentration, and the induced waveguide refractive index profile is established. It is demonstrated that the diffusion equation can be s… Show more

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Cited by 19 publications
(12 citation statements)
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“…As previously found, 42 for one-step Ag + − Na + ionexchanged waveguides, the induced surface refractive index change is directly proportional to the diffused Ag + ion concentration at the surface of the waveguides. We show here that, for the two-step ion-exchanged waveguides, both K + ions and Ag + ions contribute to the increase of the surface refractive index [ Fig.…”
Section: Resultssupporting
confidence: 72%
“…As previously found, 42 for one-step Ag + − Na + ionexchanged waveguides, the induced surface refractive index change is directly proportional to the diffused Ag + ion concentration at the surface of the waveguides. We show here that, for the two-step ion-exchanged waveguides, both K + ions and Ag + ions contribute to the increase of the surface refractive index [ Fig.…”
Section: Resultssupporting
confidence: 72%
“…82 Several methods have been used to measure ion concentration profiles. One destructive method uses etching away of thin consecutive layers and obtaining ion concentrations from the etchant solution by means of spectroscopy 83 or radiotracer analysis. Direct measurement of ion concentrations from the glass substrate edge facet can be obtained using an electron microprobe or scanning electron microscope for high-resolution scanning and analyzing the elements with energy dispersive x-ray spectroscopy or backscattered electron analysis.…”
Section: Characterization Of Ion-exchanged Waveguidementioning
confidence: 99%
“…Instead, channel wave guides can be formed by either diffusion [92], ion implantation [93] or ion exchange [94] of suitable dopant atoms directly into the substrate, but through a mask. Such waveguides are often called buried channel waveguides since they lie beneath the surface.…”
Section: Masked Ion Implantation Diffusion or Ion Exchangementioning
confidence: 99%