2022 IEEE International Reliability Physics Symposium (IRPS) 2022
DOI: 10.1109/irps48227.2022.9764432
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TCAD Investigation of Power-to-Failure Evaluation for Ultrafast Events in BJT-based ESD Protection Cells

Laura Zunarelli
1
,
Susanna Reggiani
2
,
Elena Gnani
3
et al.
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