2020
DOI: 10.1016/j.cossms.2020.100833
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TEM-based dislocation tomography: Challenges and opportunities

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Cited by 26 publications
(16 citation statements)
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“…Until recently, the prevalent technique used to study dislocation patterning has been TEM, which resolves dislocations by imaging through thin foils (∼ 200nm). Studies of foils are not necessarily representative of the bulk because the dislocations' attraction to surfaces can alter their interactions [12,13]. Deformation-induced planar boundaries typically form along nearly parallel planes and extend over several tens of micrometers.…”
Section: Introductionmentioning
confidence: 99%
“…Until recently, the prevalent technique used to study dislocation patterning has been TEM, which resolves dislocations by imaging through thin foils (∼ 200nm). Studies of foils are not necessarily representative of the bulk because the dislocations' attraction to surfaces can alter their interactions [12,13]. Deformation-induced planar boundaries typically form along nearly parallel planes and extend over several tens of micrometers.…”
Section: Introductionmentioning
confidence: 99%
“…We rst use the method like dislocation tomography 24,25 to reconstruct the distribution of those solar are tracks in three dimensions (detailed in Method), given that the contrast of the solar are tracks in TEM images can be maintained in a quite wide range of tilting angles. Figure 2b is the reconstructed image of the solar are tracks in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Deep learning (DL) based methods can be very powerful tools for performing pixel wise classification to segment objects of interest. This can significantly help to automate the analysis of microscopic images [12][13][14]. In general, state of the art DL architectures such as the U-Net [15] have been found to be very successful for image segmentation with applications ranging from the classical field of computer vision [16][17][18] to medical imaging [19][20][21].…”
Section: Introductionmentioning
confidence: 99%