2001
DOI: 10.1134/1.1371355
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Temperature behavior of electron transport in normal-metal-HTSC heterojunctions

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Cited by 16 publications
(9 citation statements)
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“…1]. The difference in electronic parameters of Au and CSCO and the surface characteristics of the CSCO/YBCO bilayer determine the potential barrier I b at the Au=CSCO interface and the junction resistance [16]. Thus, our AFM junction can be considered as an S=N=I b =AFM=D structure, where the superconducting order parameter is induced in the normal Au and the AFM CSCO layers by the proximity effect to Nb and YBCO electrodes, respectively [17].…”
mentioning
confidence: 99%
“…1]. The difference in electronic parameters of Au and CSCO and the surface characteristics of the CSCO/YBCO bilayer determine the potential barrier I b at the Au=CSCO interface and the junction resistance [16]. Thus, our AFM junction can be considered as an S=N=I b =AFM=D structure, where the superconducting order parameter is induced in the normal Au and the AFM CSCO layers by the proximity effect to Nb and YBCO electrodes, respectively [17].…”
mentioning
confidence: 99%
“…The decrease in conductivity σ at low voltages V points to a tunneling character of the current passage through the mesostructure without an LMO layer [25]. Indeed, the averaged (over the quasiparticle momentum direc tion) interface transparencies estimated from R n A by the formula [24,26,27] (5) turn out to be rather low, D = 10 -5 -10 -4 . Here, p F is the minimum Fermi momentum from LSMO and Au at the following parameters: ρ LSMO l LSMO ≈ 10 -10 Ω cm 2 and R n A = 1.5 × 10 -5 Ω cm 2 .…”
Section: Mesostructuresmentioning
confidence: 98%
“…The Au interlayer in between of Nb and YBCO layers prevents the oxidation of Nb and considerably weaken the oxygen depletion of the SIO/YBCO bilayer. Our investigation of the Nb/YBCO interface (without Au layer between superconductors) reveals much higher values of R⋅A =0.1-1 Ω×cm 2 (A is the in-plane area of MS), and no superconducting current has been observed in Nb/YBCO structures[43]. a) Temperature dependence of the resistance of MS Nb/Au/SIO/YBCO with size 40x40 µm 2 and SIO film thickness d=7nm b) I-V curve and the dependence of differential resistance dV/dI versus I, allowing to estimate the value of critical current I C at T=4.2K, c) I-V curve and dV/dI versus V, which shows singularities caused by the energy gap of the Nb electrode at T=4.2K, d) temperature dependences of the normalized critical current I C and gap voltage V ∆ , where V ∆ (4.3 K) = 0.8 mV.…”
mentioning
confidence: 69%