Thermal Stress and Strain in Microelectronics Packaging 1993
DOI: 10.1007/978-1-4684-7767-2_5
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Temperature Dependence of Thermal Expansion of Materials for Electronics Packages

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Cited by 3 publications
(1 citation statement)
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“…Differential thermal expansion between mating materials is a well-documented source o f interfacial delamination in IC packages, studied by for example [216]. CTE mismatch is amplified by thermal shock and cycling during soldering [217]. Matijasevic et al [218] described the resulting mechanisms of thermal expansion induced stress within a typical die-die attach-paddle structure, which can overcome the adhesive bond between the die and paddle, thereby resulting in delamination.…”
Section: Component Structural Analysismentioning
confidence: 99%
“…Differential thermal expansion between mating materials is a well-documented source o f interfacial delamination in IC packages, studied by for example [216]. CTE mismatch is amplified by thermal shock and cycling during soldering [217]. Matijasevic et al [218] described the resulting mechanisms of thermal expansion induced stress within a typical die-die attach-paddle structure, which can overcome the adhesive bond between the die and paddle, thereby resulting in delamination.…”
Section: Component Structural Analysismentioning
confidence: 99%