Test input generation for supply current testing of bridging faults in bipolar combinational logic circuits

High speed IDDQ test and its testability for process variation

“…Characteristic parameters are derived from the circuit files by SPICE simulation and the mean value and the variance are calculated for each inserted bridging fault. In our experiments, it is determined whether the fault can be detected with the specified level of significance(a) like in [16,17]. Since usually, either 0.1 or 0.01 is used as a, they are used in our experiments.…”

“…Since any generation methods for the test inputs have not be developed, the test inputs in Table 1 are used in our experiments. All of the bridging faults in the CUT can be activated by the test input vectors at least once, which are generated by the random algorithm presented in [16]. The test input sequence in Table 1 is obtained with random numbers.…”