Testing Reliability Equivalence Factors of a Series-Parallel Systems in Burr Type X Distribution

Migdadi, Hatim Solayman; Al-Batah, Mohammad Subhi

doi:10.9734/bjmcs/2014/9922

Cited by 8 publications

(6 citation statements)

References 6 publications

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“…26, Special Issue 1, pp. S327-S338 exponential distribution in [19], exponentiated Weibull distribution in [20], and Burr type X distribution in [21]. It is worth mentioning that all previous studies assumed the construction of a regular system and identical units with a known life distribution.…”

Section: S330mentioning

confidence: 99%

A novel and unique approach for determining the survivor equivalence factors for complex systems

Alghamdi

2022

Therm sci

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In this paper, we provide a novel method to determine the survivor equivalence factors for coherent systems, whatever the unit?s lifetime distribution and the struc?ture of the system. In order to determine the survivor equivalence factors for com?plex systems with independent units, we employ the idea of a survival signature and the Reliability Theory R package. Survival functions and mean times to failure are computed using the Reliability Theory package for systems were improved us?ing: reduction technique and duplication techniques, including: hot duplication, cold duplication with reliable switch, and cold duplication with unreliable switch. Survival survivor equivalence factors and mean survivor equivalence factors are taken into consideration as measures for comparing system improvements. For the new survivor equivalence factors method to be understood, numerical example for complex system is provided.

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Section: S330mentioning

confidence: 99%

A novel and unique approach for determining the survivor equivalence factors for complex systems

Alghamdi

2022

Therm sci

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“…In the general reliability analysis, there exist many other lifetime models of which the failure rates are only affected by the shape parameter. This problem was addressed in [25] to test the reliability equivalence factors of a series-parallel system in a Burr-type X distribution. However, a hybrid of hot and cold duplication methods has not been included in reliability research to improve system design.…”

Section: Introductionmentioning

confidence: 99%

Reliability Performance of Improved General Series-Parallel Systems in the Generalized Exponential Lifetime Model

Migdadi¹,

Almomani²,

Abu-Shawiesh³

et al. 2019

IJPE

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Based on the reduction and redundancy methods, the reliability performance of the improved general series-parallel system is considered, assuming the connected components are identically independent and follow the general exponential lifetime model. To extend previous studies, the shape parameter is modified to obtain the reliability equivalence factors of the hot and cold duplications. A hybrid of the hot and cold duplication methods is also considered. Numerical results from a practical example are investigated to illustrate the derived theoretical results of the overall study.

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“…El-Damcese and Ayoub (2011) obtained reliability equivalence factors for n independent and identical units of a parallel system by using bivariate Weibull model. Reliability equivalence factors for a general series-parallel system in Burr type X distribution are derived by Migdadi and Al-Batah (2014). Yousry et al (2013) introduced reliability equivalence factors in case of exponentiated exponential distribution.…”

Section: Introductionmentioning

confidence: 99%

Improvement of the reliability of a dependent system under copula

Temraz

2018

IJQRM

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Purpose The purpose of this paper is to analyze a parallel system consisting of n dependent components with lifetimes following Weibull distribution. FGM Copula in multivariate case is used to generate the reliability function of the original system. A reduction method is introduced to improve system reliability. Other methods of hot, cold and warm duplication are established to improve system reliability. An application is introduced to show the results and compare between different improvement methods. Design/methodology/approach In this paper, a study of a parallel system consisting of n dependent and non-identical components is introduced. Reliability function of the original system is derived by using the concepts of copula, subject to Weibull distribution. Reliability function of the original system is improved according to reduction, hot duplication, warm and cold duplication methods. Reliability equivalence factors are introduced to compare between different system designs. Numerical illustration and real-time data application are discussed to show the results obtained in this paper. Findings Copulas can be used to model the reliability of systems with dependent units. Originality/value This paper is original. Improvement of the reliability of dependent systems is not discussed in literature. Copula is a useful tool to analyze the reliability of dependent systems. The introduced model is considered as a generalization of the models discussed in literature.

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Testing Reliability Equivalence Factors of a Series-Parallel Systems in Burr Type X Distribution

Cited by 8 publications

References 6 publications

A novel and unique approach for determining the survivor equivalence factors for complex systems

A novel and unique approach for determining the survivor equivalence factors for complex systems

Reliability Performance of Improved General Series-Parallel Systems in the Generalized Exponential Lifetime Model

Improvement of the reliability of a dependent system under copula

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