The design of the test beamline at SSRF

Li, Zhongliang; Fan, Yichen; Xue, Lian; Zhang, Zengyan; Wang, Jie

doi:10.1063/1.5084671

Cited by 15 publications

(7 citation statements)

References 3 publications

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“…The at-wavelength characterization of five channel-cut crystals was determined experimentally by the above method. The experiment was carried out in the Test beamline 09B of the SSRF, which is dedicated to the development of optics, metrology, and instrumentation [ 33 ]. The photon energy of 15 keV was selected using a double crystal Si-111 monochromator with a bandwidth of ΔE/E ~10 −4 .…”

Section: Experiments and Resultsmentioning

confidence: 99%

Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique

Xue

Luo

Diao

et al. 2020

Sensors

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A speckle-based method for the X-ray crystal diffraction wavefront measurement is implemented, and the slope errors of channel-cut crystals with different surface characteristics are measured. The method uses a speckle scanning technique generated by a scattering membrane translated using a piezo motor to infer the deflection of X-rays from the crystals. The method provides a high angular sensitivity of the channel-cut crystal slopes in both the tangential and sagittal directions. The experimental results show that the slope error of different cutting and etching processes ranges from 0.25 to 2.98 μrad. Furthermore, the results of wavefront deformation are brought into the beamline for simulation. This method opens up possibilities for new high-resolution applications for X-ray crystal diffraction wavefront measurement and provides feedback to crystal manufacturers to improve channel-cut fabrication.

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Section: Experiments and Resultsmentioning

confidence: 99%

Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique

Xue

Luo

Diao

et al. 2020

Sensors

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“…We conducted quantitative characterization of the developed beam-splitting crystal in Test Beamline (BL09B) at the SSRF. BL09B is a specialized beamline for testing optical components and beamline devices [11]. BL09B is equipped with Si(111) and Si(333) double-crystal monochromators, which utilize the Bragg diffraction of crystal to monochromatize white beam.…”

Section: The Design Of Crystal and Characterization Methodsmentioning

confidence: 99%

Development of stress-free Laue diffraction crystal for x-ray beam splitting

Zhao,

Si,

Diao

et al. 2024

International Conference on Optical and Photonic Engineering (icOPEN 2023)

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“…The incident X-ray beam experienced double reflections from an Si (220) crystal to provide high monochromaticity, and the angular divergence of the beam was approximately 0.007°. The accurate hard X-ray reflectance of the multilayers with 150 bilayers was measured at 10 keV, at the X-ray test beamline (BL09B) in the Shanghai Synchrotron Radiation Facility (SSRF), China [ 24 ]. In addition to the double-crystal monochromator, an extra channel-cut crystal optics was added in front of the multilayer sample during the measurement to reduce the beam divergence down to approximately 0.001°.…”

Section: Methodsmentioning

confidence: 99%

Comparative Study of Pd/B4C X-ray Multilayer Mirrors Fabricated by Magnetron Sputtering with Kr and Ar Gas

Huang

Liu

et al. 2020

Materials

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Ultrathin Pd/B4C multilayers are suitable X-ray mirrors working at the photon energy region of 7–20 keV. To further improve the layer structure, Pd/B4C multilayers with a d-spacing of 2.5 nm were fabricated by magnetron sputtering using the heavy noble gas Kr and compared with the conventional ones fabricated by Ar. Although the Kr-sputtering process can work at a lower pressure, the interface width—especially the interface roughness—is a little larger than that made by Ar. A stronger polycrystallization and a lower content of sputter gas atoms were found in the Kr-made sample, which can be explained by the joint effect from less recoiled particles and lower sputtering pressure. A good reflectance of 68% of the Kr made multilayer was measured at 10 keV, which is only slightly lower than that of the Ar made sample (71%).

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The design of the test beamline at SSRF

Cited by 15 publications

References 3 publications

Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique

Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique

Development of stress-free Laue diffraction crystal for x-ray beam splitting

Comparative Study of Pd/B4C X-ray Multilayer Mirrors Fabricated by Magnetron Sputtering with Kr and Ar Gas

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