The Divergent beam (Kossel) x-ray method and its uses in measuring strain contours in an individual grain of Fe-3 weight percent Si transformer sheet

Yakowitz, H.

doi:10.6028/nbs.mono.130

Cited by 4 publications

(2 citation statements)

References 37 publications

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“…When solid specimens are examined in the scanning electron microscope (SEM), no directly analogous process is available. Crystallographic information can be obtained by the Kossel technique (Yakowitz, 1973) in which the fluorescent X-rays generated by the beam are diffracted by the crystal structure as they leave the specimen and form a series of conic sections on a suitably placed film. The patterns produced can be analysed to give accurate orientation and lattice spacing information.…”

Section: Introductionmentioning

confidence: 99%

The observation of crystalline materials in the scanning electron microscope (SEM)

Joy

1975

Journal of Microscopy

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Contrast effects from electron channelling in crystalline solids can be observed in the scanning electron microscope by the correct choice of operating conditions. The crystallographic symmetry and orientation of specimen areas as small as 1 pm in diameter can be determined, and detailed quantitative information obtained about the density, nature and position of defects contained within the crystal structure. The backscattered, absorbed current and transmitted electron signals may all be used. With anticipated improvements in instrumentation the technique will be capable of providing all the information currently supplied by the more complex procedures of transmission electron microscopy. I N T R O D U C T I O NThe usefulness of an electron microscope for studies in the field of materials science is greatly enhanced if the instrument can provide information about the crystallography of the specimen under observation. In the conventional transmission electron microscope (CTEM) such information can be obtained from the diffraction and Kikuchi patterns which are generated as the electrons pass through the thin specimen. These patterns make it possible to determine the orientation, symmetry, lattice spacing etc. of small selected areas of the specimen, and micrographs can be recorded in specific diffracting conditions to image defects and other crystallographic features and enable these features to be identified.When solid specimens are examined in the scanning electron microscope (SEM), no directly analogous process is available. Crystallographic information can be obtained by the Kossel technique (Yakowitz, 1973) in which the fluorescent X-rays generated by the beam are diffracted by the crystal structure as they leave the specimen and form a series of conic sections on a suitably placed film. The patterns produced can be analysed to give accurate orientation and lattice spacing information. However, the technique is only applicable to a limited range of materials, and the patterns cannot be directly viewed or combined with topographic information. Alternatively, the spatial distribution of the backscattered electrons can be recorded on a film or viewing screen (Venables &

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Section: Introductionmentioning

confidence: 99%

The observation of crystalline materials in the scanning electron microscope (SEM)

Joy

1975

Journal of Microscopy

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“…Applicability of EPMA to Kossel diffraction was demonstrated at the outset by its originator (Castaing, 1951). Related to that development was an upsurge of studies on the Kossel technique and its applications in the 1960s and 1970s [see the accounts of Tixier & Waché (1970) and Yakowitz (1973)]. The contemporary descendant of the Castaing instrument -a scanning electron microscope (SEM) -allows for convenient observations of microstructures, and for easy installation of additional devices (including heating or tensile stages).…”

Section: Introductionmentioning

confidence: 99%

A program for refinement of lattice parameters and strain determination using Kossel diffraction patterns

Morawiec

2016

J Appl Crystallogr

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The Kossel diffraction technique is well suited for investigating crystal lattices. Progress in digital recording of images opens the opportunity for simplification and improvement of the examination of Kossel patterns. Such patterns can be processed immediately after recording if appropriate computer programs are available. To provide such a tool, a new Windows‐based software for computer‐assisted analysis of Kossel patterns has been developed. With its easy‐to‐operate user interface, the program is intended to facilitate refinement of lattice parameters and determination of elastic strains. The refinement is based on matching experimental and geometrically simulated patterns, whereas the strain is obtained by matching Kossel line profiles in similar experimental patterns. The software is capable of simultaneous handling of multiple patterns.

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X-ray divergent-beam (Kossel) technique: A review

Лидер

2011

Crystallogr. Rep.

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The Divergent beam (Kossel) x-ray method and its uses in measuring strain contours in an individual grain of Fe-3 weight percent Si transformer sheet

Cited by 4 publications

References 37 publications

The observation of crystalline materials in the scanning electron microscope (SEM)

The observation of crystalline materials in the scanning electron microscope (SEM)

A program for refinement of lattice parameters and strain determination using Kossel diffraction patterns

X-ray divergent-beam (Kossel) technique: A review

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