2018
DOI: 10.3390/s18030735
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The Effect of Film Thickness on the Gas Sensing Properties of Ultra-Thin TiO2 Films Deposited by Atomic Layer Deposition

Abstract: Analyte sensitivity for gas sensors based on semiconducting metal oxides should be highly dependent on the film thickness, particularly when that thickness is on the order of the Debye length. This thickness dependence has previously been demonstrated for SnO2 and inferred for TiO2. In this paper, TiO2 thin films have been prepared by Atomic Layer Deposition (ALD) using titanium isopropoxide and water as precursors. The deposition process was performed on standard alumina gas sensor platforms and microscope sl… Show more

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Cited by 60 publications
(38 citation statements)
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“…Yield Thin lm synthesis CVD of nickel oxide thin lms were performed using a ow-type, cold-walled reactor described previously. 25 The reactor was programmed using a custom IGI Systems Lab Interface Input control box which automatically controls all temperatures and heating systems, gas ow rates and solenoid valves. CVD experiments were carried out using [Ni(dmamp 0 ) 2 ].…”
Section: Precursor Analysismentioning
confidence: 99%
“…Yield Thin lm synthesis CVD of nickel oxide thin lms were performed using a ow-type, cold-walled reactor described previously. 25 The reactor was programmed using a custom IGI Systems Lab Interface Input control box which automatically controls all temperatures and heating systems, gas ow rates and solenoid valves. CVD experiments were carried out using [Ni(dmamp 0 ) 2 ].…”
Section: Precursor Analysismentioning
confidence: 99%
“…According to our previous study [26], a metal precursor vapor pressure higher than 0.13 Torr would generate enough metal precursor vapor in our reactor for one pulse. Therefore, a temperature above 115 °C would provide sufficient vapor pressure.…”
Section: Resultsmentioning
confidence: 99%
“…The response of the sensor is varied by changing the temperature of the film from 62 to 228 C. d) Adapted under the terms of a CC-BY license. [126] Copyright 2018, The authors, published by MDPI. e-h) Adapted under the terms of a CC-BY license.…”
Section: Electronic Conductors: Metal Oxidementioning
confidence: 99%