2018
DOI: 10.1063/1.5066972
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The effect of Ni addition on Cu-Sn intermetallic growth rate values in the SAC solder

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Cited by 2 publications
(2 citation statements)
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“…Figure 2a,b show the TEM lamellar and an on-zone Cu 6 Sn 5 grain, respectively. The Cu 3 Sn layer thickened as a result of ageing at 150 • C for 500 h [2,3,23]. Kirkendall voids, which often accompany the formation of Cu 3 Sn [3], are present between the Cu 3 Sn and the OSP-Cu (Figure 2a).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Figure 2a,b show the TEM lamellar and an on-zone Cu 6 Sn 5 grain, respectively. The Cu 3 Sn layer thickened as a result of ageing at 150 • C for 500 h [2,3,23]. Kirkendall voids, which often accompany the formation of Cu 3 Sn [3], are present between the Cu 3 Sn and the OSP-Cu (Figure 2a).…”
Section: Resultsmentioning
confidence: 99%
“…The soldering process involves heating the solder alloy above its melting temperature to react with the Cu substrate to form an intimate bond. During this process, Cu 6 Sn 5 and Cu 3 Sn intermetallic compounds (IMCs) form at the interface between the solder melt and the Cu substrates [2,3]. The reactions at the interfaces between liquid solder/Cu 6 Sn 5 /Cu 3 Sn/solid substrates are complex.…”
Section: Introductionmentioning
confidence: 99%