The energy resolution of a position sensitive spectrometer based on plane crystals

Construction of a high energy resolution crystal X‐ray spectrometer to be used for wavelength‐dispersive X‐ray emission spectroscopy (WDXRS) may result in different geometrical aberrations, such as systematic X‐ray line shifts and changes of the X‐ray line shape. Most of these aberrations can be reduced by careful design of a crystal spectrometer, keeping the efficiency of the spectrometer as high as possible. The availability of high‐resolution position‐sensitive detectors and small excitation beam sizes, and therefore a possible downsized Wavelength‐dispersive X‐ray (WDX) spectrometer, increase the need for reliable simulation of aberrations involved in WDXRS. Since the experimental investigation of the impact that WDX spectrometer design has on a particular aberration is rather time‐consuming, a numerical X‐ray tracing procedure, XTRACE, has been developed and applied for this purpose. Results are given in the form of virtual X‐ray energy spectra that have been affected by the most important aberrations. Copyright © 2009 John Wiley & Sons, Ltd.

show abstract

X‐ray tracing study of crystal spectrometers for WDXRS application

Tadić

Jakšić

Božičević

2009

X-Ray Spectrometry

View full text Add to dashboard Cite

show abstract

High-energy resolution μ-XRF analysis by position sensitive spectrometer

Liu

et al. 2000

Chin.Sci.Bull.

View full text Add to dashboard Cite

Geometrical Aberrations in the Von Hamos and the Plane Bragg Crystal Spectrometers

et al. 1997

View full text Add to dashboard Cite

Numerical calculations of the effect of the finite dimensions and orientations of source and crystal are presented for plane and von Hamos Bragg crystal spectrometers for PIXE analysis, combined with a position sensitive (X-ray) detector. Analytical studies of all effects are provided. It is shown that some parameters can produce line shifts and asymmetries. A numerical model for an X-ray diffraction ray-tracing procedure for a crystal Bragg spectrometer is described.

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

The energy resolution of a position sensitive spectrometer based on plane crystals

Cited by 3 publications

References 13 publications

X‐ray tracing study of crystal spectrometers for WDXRS application

X‐ray tracing study of crystal spectrometers for WDXRS application

High-energy resolution μ-XRF analysis by position sensitive spectrometer

Geometrical Aberrations in the Von Hamos and the Plane Bragg Crystal Spectrometers

Contact Info

Product

Resources

About