2009
DOI: 10.1007/s11009-009-9132-8
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The First Passage Time Problem for Gauss-Diffusion Processes: Algorithmic Approaches and Applications to LIF Neuronal Model

Abstract: Motivated by some as yet unsolved problems of biological interest, such as the description of firing probability densities for Leaky-and-Integrate neuronal models, we consider the first-passage-time problem for Gauss-diffusion processes along the line of Mehr and McFadden (1965). This is essentially based on a space-time transformation, originally due to Doob (1949), by which any Gauss-Markov process can expressed in terms of the standardWiener process. Starting with an analysis that pinpoints certain properti… Show more

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Cited by 36 publications
(19 citation statements)
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“…We use as our model neuron the "leaky integrate-and-fire neuron," a simple yet widely used (36,(48)(49)(50)(51)(52)(53)(54)(55)(56)(57)(58)(59)(60) model of neuronal function defined by the following:…”
Section: First Passage Through a Rough Boundarymentioning
confidence: 99%
“…We use as our model neuron the "leaky integrate-and-fire neuron," a simple yet widely used (36,(48)(49)(50)(51)(52)(53)(54)(55)(56)(57)(58)(59)(60) model of neuronal function defined by the following:…”
Section: First Passage Through a Rough Boundarymentioning
confidence: 99%
“…When degradation process y ( t ) reaches a pre‐set threshold level Y L , the device is considered to be of low reliability or non‐usable; therefore, it is natural to view the lifetime termination as the point when the degradation process crosses this threshold level for the first time , . From the concept of FHT , the lifetime T is defined as T = inf( t : y ( t ) ≥ Y L | y (0) < Y L ), so the probability density function (PDF) of lifetime T at time t i is given by as: f()|tλ,yi=YLyi2π()tti3σw2normalexp()prefix−()YLyiλ()tti22σw2()tti where y i = y ( t i ). In our model, the drift coefficient λ is random; therefore, we view λ as a variable in the lifetime function.…”
Section: Methodsmentioning
confidence: 99%
“…When degradation process y(t) reaches a pre-set threshold level Y L , the device is considered to be of low reliability or non-usable; therefore, it is natural to view the lifetime termination as the point when the degradation process crosses this threshold level for the first time [15], [23]. From the concept of FHT [24][25][26], the lifetime T is defined as T = inf(t : y(t) ≥ Y L |y(0) < Y L ), so the probability density function (PDF) of lifetime T at time t i is given by [27] as:…”
Section: Brownian Motion-based Modelingmentioning
confidence: 99%
“…One can reset the process V(t) in the sense that one poses V(T−) = V th and V(T) = V r for some constant V r < V th , then one can consider the process V 2 (t) = V(t − T) to be solution of (1) with V 2 (0) = V r and I 2 (t) := I(t + T) and study the first passage time of this new process through V th (see [4,5,[26][27][28][29][30][31] and references therein); •…”
Section: The Semi-markov Leaky Integrate-and-fire Modelmentioning
confidence: 99%
“…It has been shown in [27] that under suitable assumptions on I(t), the probability survival functions of A n t → P(A n > t) are asymptotically exponential. However, in some particular settings this behavior is in contradiction with the experimental data.…”
Section: The Semi-markov Leaky Integrate-and-fire Modelmentioning
confidence: 99%