2009
DOI: 10.1016/j.nimb.2009.02.060
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The formula for the secondary electron yield at high incident electron energy from silver and copper

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Cited by 18 publications
(7 citation statements)
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“…(7) and (8) for energies above 10 keV. The experimental data reported by Xie et al 30 at normal incidence for copper (Fig. 2 of Ref.…”
Section: A Results With See Only From Anodesmentioning
confidence: 72%
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“…(7) and (8) for energies above 10 keV. The experimental data reported by Xie et al 30 at normal incidence for copper (Fig. 2 of Ref.…”
Section: A Results With See Only From Anodesmentioning
confidence: 72%
“…2 of Ref. 30) were used as the basis for parameter extraction and curve-fitting. For the energy region below 10 keV, the formulation of Lin and Joy 40 was applied, with a smooth continuous transition for the energy-dependent SEY between the two regimes.…”
Section: A Results With See Only From Anodesmentioning
confidence: 99%
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“…For a secondary electron emitter, 𝐡 is a constant and is not a function of the incident energy of primary electrons. [1,2,[4][5][6]15,19] Therefore, Eq. ( 18) for 𝐡 deduced under the condition that primary electrons at a high electron energy hit on insulators is universal for the estimation of 𝐡 under the condition that primary electrons at any energy hit on insulators.…”
Section: Top Of Valence Bandmentioning
confidence: 99%
“…The secondary electron emission is an important research topic. [1][2][3][4][5][6][7][8][9][10] Computational approaches based on the Monte-Carlo method allow us to calculate the secondary electron emission. [11][12][13][14][15] Modern technologies such as secondary electron dopant mapping [16,17] and critical dimension scanning electron microscopy [14,18] allow us to research the secondary electron emission.…”
Section: Introductionmentioning
confidence: 99%