2021
DOI: 10.1016/j.apsusc.2020.148668
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The impact of partial H intercalation on the quasi-free-standing properties of graphene on SiC(0001)

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Cited by 14 publications
(4 citation statements)
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“…One of the methods for separating graphene sheets from a substrate is hydrogen intercalation, which creates quasi-free layers on the SiC (0001) surface [16]. The quantum Hall resistance is consistent with the nominal value (half of the Klitzing background constant) within a standard deviation of 4.5 × 10 −9 , which makes this method suitable for the manufacture of electrical quantum standards.…”
mentioning
confidence: 68%
“…One of the methods for separating graphene sheets from a substrate is hydrogen intercalation, which creates quasi-free layers on the SiC (0001) surface [16]. The quantum Hall resistance is consistent with the nominal value (half of the Klitzing background constant) within a standard deviation of 4.5 × 10 −9 , which makes this method suitable for the manufacture of electrical quantum standards.…”
mentioning
confidence: 68%
“…The hydrogen-intercalated QFS graphene , (branded GET) was grown at 1600 °C on a semi-insulating vanadium-compensated nominally on-axis 15 mm × 15 mm 6H-SiC(0001) substrate (II–VI Inc.) through epitaxial CVD in the hot-wall Epigress VP508 reactor with propane as a carbon source . The in situ intercalation with hydrogen atoms took place at 1000 °C in a 900 mbar argon atmosphere.…”
Section: Methodsmentioning
confidence: 99%
“…Of particular scientific and applied interest is transfer-free p-type hydrogen-intercalated quasi-free-standing (QFS) epitaxial chemical vapor deposition (CVD) graphene grown on semi-insulating, nominally on-axis, hexagonal SiC(0001) and passivated with a thin layer of amorphous atomic-layer deposition (ALD) aluminum oxide (a-Al 2 O 3 ), as its charge carrier type and sheet density is influenced by two contradictory charge induction mechanisms.…”
Section: Introductionmentioning
confidence: 99%
“…QFS graphene [ 26 , 27 , 28 , 29 ] necessary for the graphene-based HTHS was grown on semi-insulating high-purity on-axis 4H-SiC(0001) (Cree Inc.) in a hot-wall Aixtron VP508 reactor using the epitaxial Chemical Vapor Deposition method [ 30 ], with thermally decomposed propane as a carbon source and in situ hydrogen atom intercalation [ 31 ]. The substrate was processed into a 1.6 mm × 1.6 mm Hall effect structure featuring a cross-shaped [ 32 ] 100 m × 300 m graphene mesa and four Ti/Au (10 nm / 60 nm) ohmic contacts, all passivated with a 100 nm-thick aluminum oxide (Al 2 O 3 ) layer synthesized from trimethylaluminum (TMA) and deionized water at 670 K in a Picosun R200 Advanced Atomic Layer Deposition (ALD) reactor [ 33 , 34 ].…”
Section: Methodsmentioning
confidence: 99%