2018
DOI: 10.1016/j.microrel.2018.04.016
|View full text |Cite
|
Sign up to set email alerts
|

The influence of microwave pulse width on the thermal burnout effect of an LNA constructed by a GaAs PHEMT

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 9 publications
(2 citation statements)
references
References 12 publications
0
2
0
Order By: Relevance
“…Yet, the EMP threat described above mainly causes problems in these receiver amplifier stages. The characteristic of amplifying a low-level normal signal exhibits high vulnerability to EMP transient signals with high power level; moreover, when it is exposed to EMP, the microwave receiver temporarily stops or causes permanent failure [12][13][14]. For this reason, a device that can protect the microwave receiver is becoming essential in communication systems.…”
Section: Introductionmentioning
confidence: 99%
“…Yet, the EMP threat described above mainly causes problems in these receiver amplifier stages. The characteristic of amplifying a low-level normal signal exhibits high vulnerability to EMP transient signals with high power level; moreover, when it is exposed to EMP, the microwave receiver temporarily stops or causes permanent failure [12][13][14]. For this reason, a device that can protect the microwave receiver is becoming essential in communication systems.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, they have a significant influence on the performance of RADAR systems, and are likely to be affected by high-power and strong signals, such as EMP threats [14][15][16]. These high-power signals can generate unnecessary voltages inside the device, which can lead to poor performance or destruction of the device [17,18].…”
Section: Introductionmentioning
confidence: 99%