2014
DOI: 10.1016/j.apsusc.2013.10.155
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The influence of the laser parameter on the electrical shunt resistance of scribed Cu(InGa)Se2 solar cells by nested circular laser scribing technique

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Cited by 18 publications
(12 citation statements)
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“…The evaluation of laser scribe conductivity with NCLST technique is not straight forward, and it depends on the sample properties. Zimmer et al performed many investigations on the in-process laser-induced shunt evaluation by applying very similar laser processing setup (Wang et al, 2013(Wang et al, , 2014Zimmer et al, 2014). The scribe resistance values were not comparable with the results of our NCLST measurements due to significant differences in samples electrical properties, although CIGS solar cell samples were from the same manufacturer.…”
Section: Discussioncontrasting
confidence: 64%
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“…The evaluation of laser scribe conductivity with NCLST technique is not straight forward, and it depends on the sample properties. Zimmer et al performed many investigations on the in-process laser-induced shunt evaluation by applying very similar laser processing setup (Wang et al, 2013(Wang et al, , 2014Zimmer et al, 2014). The scribe resistance values were not comparable with the results of our NCLST measurements due to significant differences in samples electrical properties, although CIGS solar cell samples were from the same manufacturer.…”
Section: Discussioncontrasting
confidence: 64%
“…Then the results are fitted with the nested circular model fitting function. More details about the measurement technique can be found in (Wang et al, 2013(Wang et al, , 2014Zimmer et al, 2014).…”
Section: Nested Circular Scribing Technique (Nclst)mentioning
confidence: 99%
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“…As an alternative approach, only the front electrode is ablated [9][10][11][12], and the absorber CIGS remains inside the P3 scribe. Here, the processing wavelength is typically within the absorption spectrum of CIGS and the transparency window of the front electrode.…”
Section: Introductionmentioning
confidence: 99%