The dependence of the etching rate of silicon on the technological, design, and electrophysical parameters that characterize the glowing conditions and the properties of a localized gas discharge is studied. Experiments are performed at a gas pressure of 10 4 -10 5 Pa and a discharge gap of 50-500 µm. Emission spec troscopy is shown to be an efficient method for controlling the beginning and the end of localized gas dis charge etching of different materials.