1999
DOI: 10.1016/s0169-4332(98)00530-3
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The oxidation of surface layers during reactive ion etching of GaAs in CF2Cl2+O2 and O2 plasmas

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Cited by 4 publications
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“…GaAs is a sensitive material in which Ga and As react readily with air and produces unstable native oxides. Also, oxygen diffusion and drifting of Ga and As under oxygen plasma treatment have been reported in [23]. To study the molecular and crystal lattice vibrations, surface compositions, chemical environment, bonding and structure of the GaAs surface [24], Raman spectroscopy was used.…”
Section: Raman Spectroscopy Of Gaas Surfacementioning
confidence: 99%
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“…GaAs is a sensitive material in which Ga and As react readily with air and produces unstable native oxides. Also, oxygen diffusion and drifting of Ga and As under oxygen plasma treatment have been reported in [23]. To study the molecular and crystal lattice vibrations, surface compositions, chemical environment, bonding and structure of the GaAs surface [24], Raman spectroscopy was used.…”
Section: Raman Spectroscopy Of Gaas Surfacementioning
confidence: 99%
“…The peak due to the native oxide of GaAs at 272.5 cm −1 (figure 3 and table 2) vanished after the activation. Instead of this peak, the strong peak at 347.8 cm −1 (figure 3 and table 2) was assigned as Ga 2 O 3 due to the oxidation of GaAs in the O 2 RIE plasma [27,23]. The formation of Ga 2 O 3 (347.8 cm −1 ) resulted from surface etching with plasma activation of GaAs, which depletes the volatile arsenic (interdiffusion with oxygen) and enriches the gallium [23,28].…”
Section: Raman Spectroscopy Of Gaas Surfacementioning
confidence: 99%
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