1999
DOI: 10.1149/1.1392506
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The Phase Identification of  H 2 SO 4 ‐ Etched InP by X‐Ray Diffraction

Abstract: The chemical composition of surface oxides grown on p-type InP(100) after etching in H 2 SO 4 /H 2 O and in H 2 SO 4 /H 2 O 2 /H 2 O etchants was investigated using X-ray wide angle diffraction and glancing angle diffraction techniques. Diffraction from only one lattice set in the matrix oxide was detected in etching with H 2 SO 4 /H 2 O solution by wide angle diffraction. Each diffraction line appeared as an interference pattern, possibly caused by beams reflected from thin layers of indium phosphate hydrate … Show more

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Cited by 6 publications
(8 citation statements)
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“…The InP surface is known to be ordered after H 2 SO 4 etching. Yao and Itaya have observed an ordered surface by in situ STM that is consistent with ideal (1 × 1) termination of the bulk structure, while Liu et al have determined by X-ray diffraction that the surface may be crystalline InPO 4 · x H 2 O after H 2 SO 4 etching . The amorphous layer in our study may have resulted from a postdeposition reaction between Cu 2 O and either InP or InPO 4 · x H 2 O.…”
supporting
confidence: 81%
“…The InP surface is known to be ordered after H 2 SO 4 etching. Yao and Itaya have observed an ordered surface by in situ STM that is consistent with ideal (1 × 1) termination of the bulk structure, while Liu et al have determined by X-ray diffraction that the surface may be crystalline InPO 4 · x H 2 O after H 2 SO 4 etching . The amorphous layer in our study may have resulted from a postdeposition reaction between Cu 2 O and either InP or InPO 4 · x H 2 O.…”
supporting
confidence: 81%
“…For example, anodic oxides mainly consist of In 2 O 3 and P 2 O 5 , while mixture combination of In 2 O 3 and InPO 4 are formed in thermal oxides. 44 In order to further determine whether or not the thicker oxide layer formed at the Au/InP interface during I-MacEtch differs in composition from the thin native oxide present elsewhere, Xray photoelectron spectroscopy (XPS) experiments were carried out. Figure 7a,b shows normalized high-resolution photoelectron core-level spectra in the regions of the P 2p and In 3d bonding states, respectively, obtained from InP surfaces that were Au-patterned (thicker oxide, red curves) and nonpatterned (exposed InP surface with native oxide, black curves) during I-MacEtch.…”
Section: Nano Lettersmentioning
confidence: 99%
“…It is known that different oxidation approaches produce different kinds of oxides for InP. For example, anodic oxides mainly consist of In 2 O 3 and P 2 O 5 , while mixture combination of In 2 O 3 and InPO 4 are formed in thermal oxides . In order to further determine whether or not the thicker oxide layer formed at the Au/InP interface during I-MacEtch differs in composition from the thin native oxide present elsewhere, X-ray photoelectron spectroscopy (XPS) experiments were carried out.…”
mentioning
confidence: 99%
“…This agrees with the results of a recent study on the Cu 2 O/InP(100) system, where we have identified the amorphous layer to be InPO 4 . In fact, InP is known to form crystalline indium phosphate hydrate (InPO 4 · x H 2 O) after H 2 SO 4 etching D, on the other hand, indicates a Cu:O ratio close to 1:1 in this region.…”
Section: Resultsmentioning
confidence: 99%