2020
DOI: 10.1016/j.mtla.2020.100642
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The role of strain localization on the electrical behavior of flexible and stretchable screen printed silver inks on polymer substrates

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Cited by 15 publications
(28 citation statements)
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“…In the experiments, monotonic and cyclic straining methods as well as cyclic bending tests are used to induce microscale cracks in the thin films, and the associated changes in electrical resistance are analysed by four point probe (4PP) measurements (Gruber et al 2009;Lu et al 2010;Lambricht et al 2013;Sim et al 2013;Glushko and Cordill 2016;Kreiml et al 2019). In addition, characteristic properties like the crack onset strain (COS) are determined, and the evolution of the mechanical damage in terms of TTCs and localised necking is studied with optical microscopy, scanning electron microscopy (SEM), atomic force microscopy (AFM) or confocal laser scanning microscopy (CLSM) methods (Renault et al 2003;Leterrier et al 2004;Cordill et al 2010;Jin et al 2011;Cordill et al 2015Cordill et al , 2016Etiemble et al 2019;Cahn et al 2020). For brittle film systems, SEM and optical observation methods are adequate because only TTCs form, and when combined with in-situ 4PP measurements, these are quite precise at determining the COS and crack spacing or density evolution as a function of applied strain or cycle.…”
Section: Introductionmentioning
confidence: 99%
“…In the experiments, monotonic and cyclic straining methods as well as cyclic bending tests are used to induce microscale cracks in the thin films, and the associated changes in electrical resistance are analysed by four point probe (4PP) measurements (Gruber et al 2009;Lu et al 2010;Lambricht et al 2013;Sim et al 2013;Glushko and Cordill 2016;Kreiml et al 2019). In addition, characteristic properties like the crack onset strain (COS) are determined, and the evolution of the mechanical damage in terms of TTCs and localised necking is studied with optical microscopy, scanning electron microscopy (SEM), atomic force microscopy (AFM) or confocal laser scanning microscopy (CLSM) methods (Renault et al 2003;Leterrier et al 2004;Cordill et al 2010;Jin et al 2011;Cordill et al 2015Cordill et al , 2016Etiemble et al 2019;Cahn et al 2020). For brittle film systems, SEM and optical observation methods are adequate because only TTCs form, and when combined with in-situ 4PP measurements, these are quite precise at determining the COS and crack spacing or density evolution as a function of applied strain or cycle.…”
Section: Introductionmentioning
confidence: 99%
“…Compared with conventional silicon-based electronic devices, flexible electronics devices can be made wearable and have the advantages of flexibility, conformality, and ultralight weight [12,13]. However, an important challenge in the development of these devices is maintaining electrical performance when the device has been bent, twisted, or stretched to a high strain, typically up to 30% for a wearable device [14].…”
Section: Introductionmentioning
confidence: 99%
“…A common conductive ink design consists of filler conductive particles or flakes, typically of silver, being embedded in a polymer binder. The electrical performance of such conductive inks has been characterized in a number of studies [14,19,24,25]. However, unlike polymer supported thin metal films, whose mechanical behavior is fairly well understood from numerous experimental [26][27][28][29][30][31][32][33][34][35][36][37] and modeling [38][39][40] studies, there is currently limited knowledge applied strain for 5025 ink deposited on TE11C substrate; (e) and (f) SEM images highlighting localized necking areas formed after 35% applied strain for 5025 ink deposited on PET substrate.…”
Section: Introductionmentioning
confidence: 99%
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