“…This approach or very similar methods have been widely used in the characterization of T g by ellipsometry. 3,4,[6][7][8][9][10][11]13,24,27,[31][32][33][34][36][37][38][39][40][41]56,57,61,62 As shown in Figure 1A, the T g for a 15-nm-thick PS film is ∼90 °C, which is ∼10 °C lower than the T g of a bulk, 350-nm-thick PS film. This result is in reasonable accord with other ellipsometry-based determinations of PS T g -confinement effects 3,6,9,10,13,15,23,[31][32][33][34][36][37][38][39][40]45 and can be explained as originating with a free-surface effect.…”