2007 8th International Conference on Electronic Packaging Technology 2007
DOI: 10.1109/icept.2007.4441402
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The Study for Thermal Analysis Technology of Three-Dimension SRAM Component

Abstract: The thermal capacity of unit volume is increasing with the development of 3D IC package density. The technology of thermal analysis and thermal design for 3D package becomes more and more important. This paper analyzes the structure and working mode of a particular 3D SRAM component. The thermal distribution is simulated with the Ansys software in which the finite element method is applied. The simulation results can be well compared with the experimental data, which further supports the reliability design of … Show more

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Cited by 3 publications
(1 citation statement)
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“…In addition, it has important significance to improve the reliability of MCM. Literatures [4]- [8] pointed out ANSYS can accurately simulate the 3-D temperature field distributions of MCM components. In [4] and [5], the error between the simulation results with ANSYS and the measurement results of 3-D temperature field distributions is 4.5% and 5.19%.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, it has important significance to improve the reliability of MCM. Literatures [4]- [8] pointed out ANSYS can accurately simulate the 3-D temperature field distributions of MCM components. In [4] and [5], the error between the simulation results with ANSYS and the measurement results of 3-D temperature field distributions is 4.5% and 5.19%.…”
Section: Introductionmentioning
confidence: 99%