The theoretical study of the measuring thermal diffusivity of semi-infinite solid using the photothermal displacement

Jeon, Pilsoo; Lee, Kwangjai; Yoo, Jae‐Hyuck; Park, Youngmoo; Lee, Jong-Hwa

doi:10.1007/bf02984319

Cited by 10 publications

(21 citation statements)

References 5 publications

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“…The range of the modulation frequencies of TO used in the experiment was chosen in such a way to ensure that the thermal diffusion length μ was of the sample's thickness size l and, thus, to eliminate the influence of the support on the PDS signal. For a pump beam much wider than the probe beam, the TF is 1D and its derivative over time has the form [9,13] …”

Section: Methodsmentioning

confidence: 99%

Application of complex geometrical optics to determination of thermal, transport, and optical parameters of thin films by the photothermal beam deflection technique

Korte

Franko

2014

J. Opt. Soc. Am. A

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In this work, complex geometrical optics is, for what we believe is the first time, applied instead of geometrical or wave optics to describe the probe beam interaction with the field of the thermal wave in photothermal beam deflection (photothermal deflection spectroscopy) experiments on thin films. On the basis of this approach the thermal (thermal diffusivity and conductivity), optical (energy band gap), and transport (carrier lifetime) parameters of the semiconductor thin films (pure TiO2, N- and C-doped TiO2, or TiO2/SiO2 composites deposited on a glass or aluminum support) were determined with better accuracy and simultaneously during one measurement. The results are in good agreement with results obtained by the use of other methods and reported in the literature.

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Section: Methodsmentioning

confidence: 99%

Application of complex geometrical optics to determination of thermal, transport, and optical parameters of thin films by the photothermal beam deflection technique

Korte

Franko

2014

J. Opt. Soc. Am. A

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“…Further, Q i is described as a periodic heat source: (3) as a type of sine wave with a specific frequency to simulate the modulated pump beam [12,16,17]. Q i has a gaussian distribution in the x and y directions.…”

Section: Numerical Investigationmentioning

confidence: 99%

“…The heat flux and temperaturebalanced condition between air and the test sample were set. After the temperature fields for the three domains are calculated, the deflection angle of the probe beam can be calculated by integrating the gradient of the index of refraction with respect to the temperature in the front air region along the probe beam path parallel to the sample surface [12,16,17]:…”

Section: Numerical Investigationmentioning

confidence: 99%

Numerical study on visualization method for material distribution using photothermal effect

et al. 2015

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Visualization and imaging techniques have become increasingly essential in a wide range of industrial fields. A few imaging methods such as X-ray imaging, computed tomography and magnetic resonance imaging have been developed for medical applications to materials that are basically transparent or X-ray penetrable; however, reliable techniques for optically opaque materials such as semiconductors or metallic circuits have not been suggested yet. The photothermal method has been developed mainly for the measurement of thermal properties using characteristics that exhibit photothermal effects depending on the thermal properties of the materials. This study attempts to numerically investigate the feasibility of using photothermal effects to visualize or measure the material distribution of opaque substances. For this purpose, we conducted numerical analyses of various intaglio patterns with approximate sizes of 1.2-6 mm in stainless steel 0.5 mm below copper. In addition, images of the intaglio patterns in stainless steel were reconstructed by two-dimensional numerical scanning. A quantitative comparison of the reconstructed results and the original geometries showed an average difference of 0.172 mm and demonstrated the possibility of application to experimental imaging.

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“…Regions 0 and 3 are air layers, which do not absorb the optical energy, while regions 1 and 2 are the film layer and the substrate, respectively. The temperature distributions for the four regions can be obtained from two-dimensional heat equations [14]. 2 1 1…”

Section: Theory and Principlementioning

confidence: 99%

“…They presented empirical equations using the relationship between the gradient of the transverse phase difference and the thermal diffusion length. Jeon et al [14] proposed a two-dimensional, analytical model for single-layered samples as well as an equation that can determine thermal diffusivity by using the transverse and normal phase curves. Lee et al [15] suggested a two-dimensional, analytical model for single-and multi-layered samples and measured the thermal conductivities of optically thick materials, such as metal film and Si wafer.…”

Section: Introductionmentioning

confidence: 99%

The measurement of thermal conductivities using the photothermal deflection method for thin films with varying thickness

Kim

Jeon

et al. 2009

J Mech Sci Technol

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This study considers non-contact methods that obviate the causes of measurement error, such as thermal contact resistance and the unnecessary destruction of samples. Among the methods, the photothermal deflection method has been adopted and developed to measure the thermal conductivities of thin-film materials. To apply the developed method for thin films, bi-layered materials are manufactured by depositing the film on Corning 7740 glass plates. The study also investigates the optimal modulation frequency, as related to the thermal diffusion length of the sample, for measuring thermal conductivities of thin films.. Aluminum, TiO 2 , and Si 3 N 4 films with micro/nanometer thickness were selected as the objects for measurement; the thermal conductivities of these films were experimentally measured. Samples of thickness ranging from 1 ㎛ to 200 ㎚ were prepared to measure the variations in thermal conductivities with thickness. It was observed that the thermal conductivity in submicroscale films decreased as the thickness was reduced.

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The theoretical study of the measuring thermal diffusivity of semi-infinite solid using the photothermal displacement

Cited by 10 publications

References 5 publications

Application of complex geometrical optics to determination of thermal, transport, and optical parameters of thin films by the photothermal beam deflection technique

Application of complex geometrical optics to determination of thermal, transport, and optical parameters of thin films by the photothermal beam deflection technique

Numerical study on visualization method for material distribution using photothermal effect

The measurement of thermal conductivities using the photothermal deflection method for thin films with varying thickness

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