2014
DOI: 10.1063/1.4891258
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Theoretical model of the polarization Coulomb field scattering in strained AlGaN/AlN/GaN heterostructure field-effect transistors

Abstract: The theoretical model of the polarization Coulomb field scattering (PCF) caused by the polarization charge density variation at the AlGaN/AlN interface in strained AlGaN/AlN/GaN heterostructure field-effect transistors has been developed. And the theoretical values for the electron drift mobility, which were calculated using the Matthiessen's rule that includes PCF, piezoelectric scattering, polar optical-phonon scattering, and interface roughness scattering, are in good agreement with our experimental values.… Show more

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Cited by 67 publications
(53 citation statements)
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“…3(a). Integration of measured gate capacitance over gate bias yielded the two-dimensional electron gas (2DEG) electron density n 2D under the gate region 2628,31 , as shown in Fig. 3(b).
Figure 1( a ) Cross-sectional view of the AlGaN/GaN HFETs.
…”
Section: Resultsmentioning
confidence: 99%
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“…3(a). Integration of measured gate capacitance over gate bias yielded the two-dimensional electron gas (2DEG) electron density n 2D under the gate region 2628,31 , as shown in Fig. 3(b).
Figure 1( a ) Cross-sectional view of the AlGaN/GaN HFETs.
…”
Section: Resultsmentioning
confidence: 99%
“…In AlGaN/GaN HFETs, the main scattering mechanisms include polarization Coulomb field (PCF), polar optical phonon (POP), acoustic phonon (AP), interface roughness (IFR), and dislocation (DIS) scatterings 26,31,4250 . R can be determined by the scattering theories of the 2DEG electrons in AlGaN/GaN HFETs 31,38,4650 .…”
Section: Resultsmentioning
confidence: 99%
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