1995
DOI: 10.1109/58.384444
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Theoretical study on SAW characteristics of layered structures including a diamond layer

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Cited by 203 publications
(76 citation statements)
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“…where eff is the coefficient of effective viscosity, eff = /(1 + ( )), and and are the coefficients of viscosity and Knudsen number, respectively [15].…”
Section: Basic Theorymentioning
confidence: 99%
“…where eff is the coefficient of effective viscosity, eff = /(1 + ( )), and and are the coefficients of viscosity and Knudsen number, respectively [15].…”
Section: Basic Theorymentioning
confidence: 99%
“…Theoretical study of SAW characteristics with multilayered structure can be performed by the conventional approach using Campbell's method or the transfer matrix approach. 12,13 However, these methods are only applicable to insulating layers. Previously, Reinhardt and his coauthors extended the scattering matrix method to metals, 18 so the conductive Metglas layer in our case can be taken into account.…”
Section: Theoretical Modelmentioning
confidence: 99%
“…Previously, it has been demonstrated that the SAW velocity can be dramatically increased from 2600 m/s up to 10,000 m/s by insertion of a diamond layer with much higher Young's modulus between the piezoelectric layer and the silicon substrate. 12,13 In current MESAW, it is our interest to study how the applied magnetic field alter the center frequency of SAW by dynamically varying the Young's modulus (E) of the neighboring Metglas substrate.…”
Section: Introductionmentioning
confidence: 99%
“…Highly c-axis-oriented AlN films were achieved on the substrate by rf magnetron sputtering, and are assumed to be independent of the substrate polarity [7]. Following the similar approach as developed by Campbell and Jones [10][11][12], a matrix method is employed here to calculate the SAW velocity in a layered piezoelectric structure. The acoustic and electric fields in media 1 and 2 can be expressed as…”
Section: Methods Of Analysismentioning
confidence: 99%
“…Following the approach proposed by Campbell and Jones [10,11], a matrix method is presented to determine SAW characteristics of layered piezoelectric structures with IDTs and/or metal thin films deposited at different interfaces. Detailed derivations are discussed in Section II.…”
Section: Introductionmentioning
confidence: 99%