2015
DOI: 10.1063/1.4921335
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Theory and analysis of operating modes in microplasmas assisted by field emitting cathodes

Abstract: Motivated by the recent interest in the development of novel diamond-based cathodes, we study microplasmas assisted by field emitting cathodes with large field enhancement factors using a simplified model and comparisons with particle-in-cell with Monte Carlo collision (PIC-MCC) simulations and experiments. The model used to determine current-voltage characteristics assumes a linearly varying electric field in the sheath and predicts transition from an abnormal glow to arc mode at moderate current densities in… Show more

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Cited by 15 publications
(8 citation statements)
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References 50 publications
(53 reference statements)
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“…Similarly, one may add an external resistor to control device current in microplasma devices [21]- [23]. These experiments [21] motivated one-dimensional planar particle-in-cell (PIC) simulations incorporating an external resistor [22] with good agreement with experimental results [21]; however, the conditions were not in the field emission dominated regime.…”
Section: Introductionmentioning
confidence: 69%
See 1 more Smart Citation
“…Similarly, one may add an external resistor to control device current in microplasma devices [21]- [23]. These experiments [21] motivated one-dimensional planar particle-in-cell (PIC) simulations incorporating an external resistor [22] with good agreement with experimental results [21]; however, the conditions were not in the field emission dominated regime.…”
Section: Introductionmentioning
confidence: 69%
“…When R < Z tp , electron emission transitions from FN to CL directly, while electron emission transitions from FN to OL when R > Z tp . Thus, the resistance plays a critical role in the significance of space charge on emission, which has important effects on field emitters in both vacuum [20] and microplasma generation [22]. This becomes particularly important as gap size is reduced below ∼1 µm [17], which is close to the triple point for nitrogen [18], which should be close to that of air.…”
Section: Discussionmentioning
confidence: 99%
“…Simulation done by Venkatraman et al [44][45][46][47] suggests that ion number density near the cathode causes the ion-enhancement in microelectromechanical devices. On the other hand, in the breakdown of a gas, usually termed Townsend's breakdown, there are two primary mechanisms that contribute to a significant rise in charge carriersgaseous charge production through electron impact ionization (the α process) and cathode charge production through secondary emission (the γ process) [41,47,48]. Secondary emission is the electron emission from cathode materials due to bombarding particles/photons and is typically dominated by ions through Auger processes, though incident photons and metastable ions can also be a factor.…”
Section: Discussionmentioning
confidence: 99%
“…Additionally, it has been simulated that materials showing high FEE characteristics can markedly improve the performance of microplasma device characteristics. [64,65] Figure 9c shows the plasma illumination (PI) photographs of the microplasma devices, signifying that the D-ECNW nanostructures as a cathode ignited the plasma at a low voltage of 330 V corresponding to a threshold field of 0.33 V µm −1 . Also, the intensity of the PI photographs increases systematically with the applied voltage.…”
Section: Plasma Illumination Studies Of Diamond-enhanced Carbon Nanowallsmentioning
confidence: 99%