2010
DOI: 10.1080/09500831003800863
|View full text |Cite
|
Sign up to set email alerts
|

Theory of ultrathin films at metal–ceramic interfaces

Abstract: A theoretical model for understanding the formation of interfacial thin films is presented, which combines density functional theory calculations for interface energies with thermodynamic modeling techniques for multicomponent bulk systems. The theory is applied to thin film formation in VC-doped WC-Co cemented carbides. It is predicted that ultrathin VC films may exist in WC/Co interfaces at the high temperature sintering conditions where most of the WC grain growth occurs, which provides an explanation of th… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

1
16
1

Year Published

2011
2011
2023
2023

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 23 publications
(18 citation statements)
references
References 35 publications
1
16
1
Order By: Relevance
“…14) They also determined that this ultrathin layer would hinder W diffusion into or out of the WC grains. If such an ultrathin layer were to exist stably at the WC(0001) surface, it is believed that the WC grain growth would then be strongly inhibited compared with the other surface.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…14) They also determined that this ultrathin layer would hinder W diffusion into or out of the WC grains. If such an ultrathin layer were to exist stably at the WC(0001) surface, it is believed that the WC grain growth would then be strongly inhibited compared with the other surface.…”
Section: Discussionmentioning
confidence: 99%
“…7,13) The slight variation in concentration seen between the two different cooling rates for the solid-state-sintered specimen does, however, suggest the presence of a segregation layer at 1473 K. The minimal grain growth during solid-state sintering could be caused by a strong restriction of the dissolution-reprecipitation of the WC phase due to the existence of the (V,W,Cr)C x segregation layer formed under increasing temperature. Based on a thermodynamic calculation by Johansson and Wahnström,14) the (V,W,Cr)C x phase would be expected to dissolve in the Co phase. Moreover, the fact that the WC grain size of the liquid-state-sintered specimen was larger than that of the solid-state-sintered specimen suggests that grain growth during liquid-state sintering is made possible by dissolution of the (V,W,Cr)C x layer on the WC surface formed under increasing temperatures, in addition to an increase in the sintering temperature.…”
Section: Discussionmentioning
confidence: 99%
“…69) Recently the existence of the (W,V)C X layers during liquid-phase sintering is confirmed by ab-initio calculations. 70) …”
Section: Interface Structural Change Induced By Dopant Segregationmentioning
confidence: 99%
“…For modeling of interfaces with complex bonding, DFT has proved its usefulness, 23,24 and the WC/Co interface has been previously studied by us with same method. 3,[25][26][27] In this paper, our previous modeling is extended by also including configuration free energies into an interface model which we explicitly couple with thermodynamic modeling of the W-C-Co-M system. Configuration free energies at finite temperatures are obtained from Monte Carlo (MC) simulations with interactions based on the cluster expansion (CE) method.…”
Section: Introductionmentioning
confidence: 99%
“…It has been well established that the appearance of certain interfacial "phases" different from those of the adjoining bulk phases (e.g., segregation structures, amorphous wetting films, etc.) can be understood from thermodynamic considerations; [1][2][3][4][5][6] the disparate interfacial phases are equilibrium states stabilized by the interface. The term "complexion" has been suggested to separate these interfacial phases from ordinary bulk phases.…”
Section: Introductionmentioning
confidence: 99%