1978
DOI: 10.1002/pssa.2210470239
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Thermally stimulated and tunneling luminescence and frenkel defect recombination in KCl and KBr at 4.2 to 77 K

Abstract: The thermally stimulated and tunneling luminescence spectra of X‐irradiated KCl and KBr, as well as thermal bleaching and thermally stimulated current of X‐irradiated KBr are studied at 4.2 to 77 K. The activation energies of I‐ and H‐centre thermal diffusion are determined. The possibilities of radiative tunneling charge transfer and radiative recombination of the F‐ and H‐centres, as well as possible mechanisms of I‐centre production are considered.

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Cited by 58 publications
(37 citation statements)
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“…This finding coincides well with that established in the 1970s by Latvian physicists on alkali halogen crystals (Aboltin et al, 1978).…”
Section: Fig 2 Ionic Conductivity Measuring Cell 1 -Feldspar; 2 -Csupporting
confidence: 92%
“…This finding coincides well with that established in the 1970s by Latvian physicists on alkali halogen crystals (Aboltin et al, 1978).…”
Section: Fig 2 Ionic Conductivity Measuring Cell 1 -Feldspar; 2 -Csupporting
confidence: 92%
“…Поэтому о количестве созданных ВУФ-радиацией в ЩГК дефектов судили по фотостимулированной в F-полосе поглощения люминесценции специально вве-денных в кристалл примесных ионов (люминесцентный зонд) [89] или электронной эмиссии [98]. Позднее за меру созданных ВУФ-радиацией в большинстве гране-центрированных ЩГК и объемноцентрированных CsCl и CsBr α−I или F−H пар ДФ стали использовать и так называемую α-люминесценцию (излучательный распад созданного фотоном в области α-центра (ν a ) связанного e 0 ) или туннельную люминесценцию при перезарядке F * −H пар ( * означает возбужденное со-стояние, в которое при фотостимуляции переходит F-центр) [9,58,66,97,[99][100][101][102][103][104][105].…”
Section: международная школа-семинар "unclassified
“…Но и такие ДФ неподвижны в ЩГК лишь при гелиевой температуре, первыми при нагреве до ∼ 20−40 K становятся подвижными интерстициалы (обычно сначала I-и затем H-центры) и рекомбинируют с F-центрами, остающимися неподвижными в ЩГК и других широкощелевых материалах до очень высоких температур (см., например, [74,94,107] и цитируемую там литературу). Низкотемпературный отжиг пар ДФ изучен экспериментально с использованием методов оптического поглощения, ЭПР и термостимулированной люминесценции [9,58,77,[99][100][101][102][103][104], теоретическое модели-рованием этих диффузионно-контролируемых процессов осуществлено в [108][109].…”
Section: международная школа-семинар "unclassified
“…About 95% of such anion FDs are shortlived ones (10 -11 −10 -1 s) [3][4][5][6][7][9][10][11], while the accumulation of so-called long-lived structural defects which are stable for hours, days and months plays a crucial role in radiation-induced material degradation, therefore, being a limitation for many applications [12][13][14][15][16]. It is experimentally proved that low-temperature irradiation leads to the creation of two types of FD pairs: a classical Frenkel pair is defined as a positively charged anion vacancy (v a , α center) and an interstitial halide ion ( , a i − I center), while a pair of neutral FDs consists of an F center (an electron trapped by an anion vacancy, v a e) and an H center (a dihalide molecule 2 X − located in one anion site, 0 ) a i [1][2][3][4][5][6][7][8][9][17][18][19].…”
Section: Introductionmentioning
confidence: 99%
“…If the recombination occurs between defects within spatially separated (isolated) pairs, the annealing stages are connected with the migration distance of a mobile defect toward its complementary counterpart in the pair. In x-irradiated AHCs, the situation is more complicated because besides F-H or α-I pairs, complex groups of spatially correlated defects, for instance F-I-V k triplets, are also formed during irradiation (see, e.g., [2,17,[31][32][33]). The formation of such and similar defect triplets/groups was detected in KBr, NaCl, and LiF even under low-temperature VUV irradiation, when an exciting photon is able to form simultaneously two-three spatially close EEs (via the multiplication process), which undergo transformation into various defect groups [32][33][34].…”
Section: Introductionmentioning
confidence: 99%