2016
DOI: 10.1016/j.mee.2016.01.005
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Thermo-mechanical transduction suitable for high-speed scanning probe imaging and lithography

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Cited by 25 publications
(17 citation statements)
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“…Patterning is performed in different ways, such as mechanical scratching, local heating, and field emission [124]. Probes based on electrothermal bimorphs have been used for AFM [125], SPN [124], and combined functionality systems [113,126]. For fast imaging of a large surface, an array setup is desirable.…”
Section: Applications Of Bimorph Actuatorsmentioning
confidence: 99%
“…Patterning is performed in different ways, such as mechanical scratching, local heating, and field emission [124]. Probes based on electrothermal bimorphs have been used for AFM [125], SPN [124], and combined functionality systems [113,126]. For fast imaging of a large surface, an array setup is desirable.…”
Section: Applications Of Bimorph Actuatorsmentioning
confidence: 99%
“…28 Due to tailoring of the material properties of the probes, a static displacement in range of 10 lm has been realized. 14 This was achieved by decreasing of the silicon layer thickness, combined with an enhancement of the thermal expansion coefficient of the actuator material (Al þ Mg). The boosted thermal expansion mismatch leads to increased actuation efficiencies, but also to amplified cross-sensitivities with respect to environmental temperature fluctuations.…”
Section: Determination Of Piezoresistive Read-out Noisementioning
confidence: 99%
“…48,49 Lithographic processes, which are spatially confined to the sub-10 nm scale are yielded by the highly localized electric field and the use of tip-sample distances well below 100 nm. Based on the thermomechanically actuated, piezoresistive, so called active cantilever technology 14,50 a scanning probe lithography 06G101-7 Rangelow et al: Active scanning probes 06G101-7 platform 18,50 able to image, inspect, align and pattern features at the single-digit nanoregime was developed. A corresponding example, patterned in positive tone developmentless mode, is summarized in Fig.…”
Section: E Field Emission Scanning Probe Lithographymentioning
confidence: 99%
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“…In this case, a spring beam integrates a microheater. When the microheater is electrically biased, due to thermal expansion coefficients of various materials forming the cantilever, the entire structure starts to displace [4]. This way deflection in the frequency range of up to several MHz can be induced [5].…”
Section: Introductionmentioning
confidence: 99%