2020
DOI: 10.21303/2585-6847.2020.001475
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THERMODYNAMIC, THERMAL AND ELASTIC PROPERTIES OF TITANIUM NITRIDE TiN: COMPARISON OF VARIOUS DATA AND DETERMINATION OF THE MOST RELIABLE VALUES

Abstract: The analysis of literary data on thermodynamic, thermal and elastic properties of titanium nitride TiN which included values Debye temperature θD, volume coefficient of thermal expansion αV and bulk modulus B under standard conditions is carried out. It has been shown that the known data have a significant spread of values from 20 to 43 %. The 8 most rational variants of optimizing calculations are proposed, which make it possible to reveal the most reliable values of some TiN parameters. At the same time, the… Show more

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Cited by 8 publications
(8 citation statements)
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“…This model’s expression for the behavior of can be shown as 36 where is the superconducting critical temperature of a bulk sample, b is the characteristic length of electron wave leakage, and N (0) V is the BCS coupling constant. By using known values for the Debye temperature (for TiN of 746–769 K 38 ), and the superconducting energy gap of 3 meV, we can extract the BCS coupling of N(0)V = 0.165 and use it to determine the leakage parameters in our films. Considering the disordered nature of sputtered films, one can further modify Eq.…”
Section: Resultsmentioning
confidence: 99%
“…This model’s expression for the behavior of can be shown as 36 where is the superconducting critical temperature of a bulk sample, b is the characteristic length of electron wave leakage, and N (0) V is the BCS coupling constant. By using known values for the Debye temperature (for TiN of 746–769 K 38 ), and the superconducting energy gap of 3 meV, we can extract the BCS coupling of N(0)V = 0.165 and use it to determine the leakage parameters in our films. Considering the disordered nature of sputtered films, one can further modify Eq.…”
Section: Resultsmentioning
confidence: 99%
“…where 𝛽 = −3Y𝛼 L /𝜌 is a constant, containing the Young modulus Y = 300 GPa (highest value in the temperature range considered in [64]), the linear expansion coefficient 𝛼 L = 8.3 × 10 −6 K −1 and the density 𝜌 = 5.21 × 10 3 kg m −3 of TiN. [65,66] By solving the above equation, the deformation 𝜂(z, t) along the z-direction is retrieved at each temporal delay (see Section 7 for details), and then the skin layer thickness variation can be determined as Δd 0 (t) = ∫ d 0 0 𝜂(z, t)dz. This modulation is in turn responsible for a plasma frequency modulation in the skin layer, which can be computed as:…”
Section: Resultsmentioning
confidence: 99%
“…The phenomenon can be properly described by the D'Alembert equation for the displacement u along z ‐direction, with the temperature as driving term: 2u(z,t)t2badbreak=v22u(z,t)z2goodbreak+βTfalse(zfalse)z$$\begin{equation} \frac{\partial ^2 u(z,t)}{\partial t^2} = v^2\frac{\partial ^2 u(z,t)}{\partial z^2} + \beta \frac{\partial T(z)}{\partial z} \end{equation}$$where β = −3 Y α L /ρ is a constant, containing the Young modulus Y = 300 GPa (highest value in the temperature range considered in [64]), the linear expansion coefficient α L = 8.3 × 10 −6 K −1 and the density ρ = 5.21 × 10 3 kg m −3 of TiN. [ 65,66 ] By solving the above equation, the deformation η( z , t ) along the z ‐direction is retrieved at each temporal delay (see Section 7 for details), and then the skin layer thickness variation can be determined as normalΔd0(t)=0d0η(z,t)normaldz$\Delta d_{0}(t) = \int _0^{d_{0}}\eta (z,t) \mathrm{d}z$. This modulation is in turn responsible for a plasma frequency modulation in the skin layer, which can be computed as: normalΔωP(t)badbreak=12ωPd0normalΔd0(t).$$\begin{equation} \Delta \omega _P(t) = -\frac{1}{2}\frac{\omega _P}{d_{0}}\Delta d_{0}(t).…”
Section: Resultsmentioning
confidence: 99%
“…where T c ∞ is the superconducting critical temperature of a bulk sample, b is the characteristic length of electron wave leakage, and N(0)V is the BCS coupling constant. By using known values for the Debye temperature θ D (for TiN of 746-769 K 36 ), and the superconducting energy gap ∆ of 3 meV, we can extract the BCS coupling of N(0)V = 0.165 and use it to determine the leakage parameters in our films. Considering the disordered nature of sputtered films, one can further modify Eq.…”
Section: Resultsmentioning
confidence: 99%