2017
DOI: 10.1134/s1063782617110112
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Thermoelectric effects in nanoscale layers of manganese silicide

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Cited by 7 publications
(6 citation statements)
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“…The measurement error of the Seebeck coefficient was ~5%. Detailed information on the Seebeck coefficient measurement can be found in [17,18,31]. The electrical resistance of the investigated thin films was also recorded by measuring the I-V characteristic with a classical two-contact circuit.…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…The measurement error of the Seebeck coefficient was ~5%. Detailed information on the Seebeck coefficient measurement can be found in [17,18,31]. The electrical resistance of the investigated thin films was also recorded by measuring the I-V characteristic with a classical two-contact circuit.…”
Section: Methodsmentioning
confidence: 99%
“…Resistance recording was carried out upon keeping the temperatures of two stages equal. More details on the technique can be found in [17,18,34]. The measurement error for resistivity was ~1%.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…[3]. Despite the intensive development of multiple approaches to obtain thermoelectric materials with promising properties based on low-dimension structures (nanofilms [4,5], quantum wires [6], etc. ), highly-effective and low-cost thermoelectrics can be produced on the basis of 3D nanocrystalline structures [7,8].…”
Section: Introductionmentioning
confidence: 99%
“…Одним из подходов к созданию термоэлектрических материалов с высоким КПД является использование наноструктур с пониженной размерностью -наноразмерных пленок [4,5] и квантовых проволок [6]. Однако, как отмечается в [7], с точки зрения перспективы получения коммерчески доступных высокоэффективных термоэлектриков более актуальной задачей является их создание на основе объемных нанокристаллических материалов.…”
Section: Introductionunclassified