Thermoluminescence glow-curve deconvolution functions for mixed order of kinetics and continuous trap distribution

Kitis, G.; Gómez-Ros, J.M.

doi:10.1016/s0168-9002(99)00876-1

Cited by 81 publications

(25 citation statements)

References 6 publications

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“…In this case, the trap level is not regarded as a discrete energy level located in the band gap of the host material, but rather a continuum of energy levels around a certain mean value. This possibility has been explored by various authors, 21,[26][27][28][29][30][31][32][33][34][35][36][37][38][39][40][41] and three main types of trap distributions have been considered: uniform, exponential, and Gaussian profiles.…”

Section: Continuous Trap Depth Distributionsmentioning

confidence: 99%

Revealing trap depth distributions in persistent phosphors

et al. 2013

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Persistent luminescence or afterglow is caused by a gradual release of charge carriers from trapping centers. The energy needed to release these charge carriers is determined by the trap depths. Knowledge of these trap depths is therefore crucial in the understanding of the persistent luminescence mechanism. Unfortunately, the trap depths in persistent phosphors are often difficult to evaluate in an accurate and reliable way. The existing analysis methods are mostly based on single experiments, or they ignore the possibility of a continuous distribution of trap depths. We present a procedure to accurately probe the activation energies, even in the presence of a continuous distribution of energy levels. By performing a series of thermoluminescence experiments with varying excitation duration and at varying excitation temperature, and employing the initial rise analysis method, the depth and shape of such a distribution can be estimated. As an example, we investigated the trap system in the violet persistent phosphor CaAl 2 O 4 :Eu,Nd, and show that it consists of a Gaussian-shaped distribution of trap depths. The maximal density of traps lies in the region around 0.9 eV, but the distribution extends to 0.7 eV on the shallow side and 1.2 eV on the deep side. The described procedure can be used to obtain a clear view of the trap system in other persistent phosphors as well. This can lead to a better understanding of the nature of these trapping centers, and the role they play in the persistent luminescent mechanism.

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Section: Continuous Trap Depth Distributionsmentioning

confidence: 99%

Revealing trap depth distributions in persistent phosphors

et al. 2013

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“…The computerized glow-curve deconvolution (CGCD) has been the most common technique for the TL glowcurve analysis (Horowitz and Yossian, 1995;Kitis and Gomez-Ros, 2000). The studies on the TL of solids were dominated by the well known first-order kinetic (Randall and Wilikin, 1945) and second-order kinetics (Garlick and Gibson, 1948).…”

Section: Introductionmentioning

confidence: 99%

The deconvolution of thermoluminescence glow-curves using general expressions derived from the one trap-one recombination (OTOR) level model

Sadek

Eissa

Basha

et al. 2015

Applied Radiation and Isotopes

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“…These glow curves were analyzed considering the mixed-order kinetics (MOK) model, which was considered the more adequate model, because they exhibited a complex luminescence glow emission; however, there are other possibilities (Gomez-Ros et al, 2006a) to analyze the trapped charge distribution assuming a Gaussian or exponential distribution due to the thermal release of charge carriers from the trapping centers. Because the structure of the TL glow curve was complex, a computerized glow curve deconvolution (CGCD) was used (Kitis and Gomez-Ros, 2000) to obtain the kinetic parameters, the activation energy E [eV] and the frequency Table 1 Characteristics of the polymer films with 0.025 ml/0.25 in 2 dimensions.…”

Section: Resultsmentioning

confidence: 99%