Thickness dependence of microstructure in thin La0.7Sr0.3MnO3films grown on (1 0 0) SrTiO3substrate

Vaghefi, P. Mirzadeh; Baghizadeh, A.; Willinger, Marc Georg; Pereira, M. J.; Mota, D. A.; Almeida, Bernardo; Moreira, J. Agostinho; Amaral, V. S.

doi:10.1088/1361-6463/aa80bf

Cited by 5 publications

(1 citation statement)

References 35 publications

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“…The manganite films have usually wavy surfaces, independently of their thickness. This morphology is usually observed in perovskite oxides grown on silicon by PLD and it is probably a consequence of strains induced along the stacking of the heterostructure [23,24]. The analysis of the interfaces was made by high resolution TEM (HR-TEM) - Figs.…”

Section: Results and Discussion 31 Stacking Crystalline Structure mentioning

confidence: 99%

Nanoscale structural characterization of manganite thin films integrated to silicon correlated with their magnetic and electric properties

et al. 2020

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A detailed nanoscale structural characterization was performed on high-quality La0.66Sr0.33MnO3 (LSMO) thin films of different thicknesses and deposited by pulsed laser deposition onto buffered Si (100) substrates. A multilayered structure built of Y0.13Zr0.87O2 (YSZ) and CeO2 layers was used as buffer in order to optimize the manganite films growth. The stacking of the different layers, their morpholohy, composition and strains were analysed using different experimental techniques. In-situ characterization of the films, performed with reflection high-energy electron diffraction, revealed their epitaxial growth and smooth surfaces. High-resolution transmission electron microscopy (HR-TEM) images showed sharp interfaces between the constituents lattices and combined with energy-dispersive X-ray analysis allowed us to determine that there was no ion interdifussion across them. The Fourier-Fast-Transform of the HR-TEM images was used to resolve the epitaxy relationship between the layers, resulting in [100] LSMO (001) ‖ [110] CeO2 (001) ‖ [110] YSZ (001) ‖ [110] Si (001). The LSMO thin films were found to be ferromagnetic and metallic at low temperature regardless their thickness. The effect of strains and defects was only detected in films thinner than 15 nm and put in evidence by X-ray diffraction patterns and correlated with magnetic and electrical parameters.

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Section: Results and Discussion 31 Stacking Crystalline Structure mentioning

confidence: 99%

Nanoscale structural characterization of manganite thin films integrated to silicon correlated with their magnetic and electric properties

et al. 2020

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Self-assembled La0.67Sr0.33MnO3 epitaxial nanocolumn films towards future flexible spintronic devices

Shen

et al. 2020

Materials Today Physics

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Thickness dependence of microstructure and properties in Be2C coatings as a promising ablation material

Jin

Zhang

et al. 2019

Matter and Radiation at Extremes

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Beryllium carbide (Be2C) thin films have proven to be promising ablation materials, but the properties of Be2C coatings of the greater thickness required for inertial confinement fusion capsules are still unknown. In this work, Be2C coatings of various thicknesses (0.3–32.9 µm) are prepared by DC reactive magnetron sputtering. The influence of thickness on crystal properties, microstructure, and optical properties is investigated. The results indicate that the crystallinity of polycrystalline Be2C films improves with increasing thickness, while the grain size (∼5 nm) and texture properties (without a preferred orientation) have only a weak dependence on thickness. A uniform featureless microstructure and smooth surface (root mean square roughness ∼8 nm) are observed even in thick (32.9 µm) films, despite the presence of defects induced by contaminants. High densities (2.19–2.31 g/cm3) and high deposition rates (∼270 nm/h) are realized, with the latter corresponding to the upper limit for the fabrication of Be2C coatings by magnetron sputtering. The transmittance of the films in the near-infrared region remains at a high level (>80%) and has only a weak dependence on thickness, while the transmittance in the visible region decreases with increasing thickness. In addition, the optical bandgap is estimated to be about 1.9 eV and decreases with increasing thickness owing to the presence of defects.

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Thickness dependence of microstructure in thin La_0.7Sr_0.3MnO₃films grown on (1 0 0) SrTiO₃substrate

Cited by 5 publications

References 35 publications

Nanoscale structural characterization of manganite thin films integrated to silicon correlated with their magnetic and electric properties

Nanoscale structural characterization of manganite thin films integrated to silicon correlated with their magnetic and electric properties

Self-assembled La0.67Sr0.33MnO3 epitaxial nanocolumn films towards future flexible spintronic devices

Thickness dependence of microstructure and properties in Be2C coatings as a promising ablation material

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