1999
DOI: 10.1063/1.371579
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Thin film growth and band lineup of In2O3 on the layered semiconductor InSe

Abstract: Thin films of the transparent conducting oxide In 2 O 3 have been prepared in ultrahigh vacuum by reactive evaporation of indium. X-ray diffraction, optical, and electrical measurements were used to characterize properties of films deposited on transparent insulating mica substrates under variation of the oxygen pressure. Photoelectron spectroscopy was used to investigate in situ the interface formation between In 2 O 3 and the layered semiconductor InSe. For thick In 2 O 3 films a work function of ϭ4.3 eV and… Show more

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Cited by 95 publications
(53 citation statements)
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“…The E 2D (L) dependence for p-type InSe is similar to that reported previously for n-type InSe [14,15]. Following annealing, the thickness of the InSe layer is reduced and the air/InSe interface is replaced by In 2 O 3 /InSe, which we model as a half-infinite quantum well using the band alignment between In 2 O 3 and InSe from [39] (dashed line in figure 4(a)). The conduction band (CB) minimum of In 2 O 3 lies above that of InSe by ΔE c = 0.29 eV, whereas the valence band (VB) edge of In 2 O 3 lies below the VB of InSe by ΔE v = 2.05 eV ( figure 4(b)).…”
Section: Quantum Confinement In Inse/in 2 O 3 Heterostructuressupporting
confidence: 75%
“…The E 2D (L) dependence for p-type InSe is similar to that reported previously for n-type InSe [14,15]. Following annealing, the thickness of the InSe layer is reduced and the air/InSe interface is replaced by In 2 O 3 /InSe, which we model as a half-infinite quantum well using the band alignment between In 2 O 3 and InSe from [39] (dashed line in figure 4(a)). The conduction band (CB) minimum of In 2 O 3 lies above that of InSe by ΔE c = 0.29 eV, whereas the valence band (VB) edge of In 2 O 3 lies below the VB of InSe by ΔE v = 2.05 eV ( figure 4(b)).…”
Section: Quantum Confinement In Inse/in 2 O 3 Heterostructuressupporting
confidence: 75%
“…Compared with asfabricated devices, S was reduced from 600 mV dec 21 to 160 mV dec 21 , along with improvement in I on /I off ($1 Â 10 6 ), and a shift in V T from 21.16 V to 20.27 V. The improvement in S is due to change in terms of a reduction in the interfacial trap states and in fixed surface charge states 25 . Ozone treatment not only removes defects and contamination from the nanowire surface, but also changes the work function 29,30 . Ozone is also expected to increase the density of oxygen vacancies near the nanowire surface.…”
Section: Resultsmentioning
confidence: 99%
“…Because of the high doping level of In 2 O 3, it is feasible that the Fermi level is close to the conduction band edge. 42 The extrapolation of the leading edge of high energy electrons in UPS spectra (Fig. 8) gives the position of the valence band maximum at the oxide surface, E VBM .…”
Section: Structural Chemical and Electronic Properties-mentioning
confidence: 99%