2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774)
DOI: 10.1109/redw.2004.1352911
|View full text |Cite
|
Sign up to set email alerts
|

TID and SEE testing results of Altera Cyclone field programmable gate array

Abstract: Public reporting burden for this collection of information is estimated to average 1 hour per response, including the time for reviewing instructions, searching existing data sources, gathering and maintaining the data needed, and completing and reviewing this collection of information. Send comments regarding this burden estimate or any other aspect of this collection of information, including suggestions for reducing this burden to Department of Defense, Washington Headquarters Services, Directorate for Info… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…Report [17] shows that the Altera Cyclone SRAM-based FPGA can accumulate 1 Mrad(Si) without functional or parametric failure. The test was completed over a decade ago, when test standards had not been updated for FPGAs.…”
Section: Tid In Fpgasmentioning
confidence: 99%
“…Report [17] shows that the Altera Cyclone SRAM-based FPGA can accumulate 1 Mrad(Si) without functional or parametric failure. The test was completed over a decade ago, when test standards had not been updated for FPGAs.…”
Section: Tid In Fpgasmentioning
confidence: 99%