Tilted Wave Fizeau Interferometer for flexible and robust asphere and freeform testing

Abstract

Tilted Wave Interferometry (TWI) is a measurement technique for fast and flexible interferometric testing of aspheres and freeform surfaces. The first version of the tilted wave principle was implemented in a Twyman-Green type setup with separate reference arm, which is intrinsically susceptible to environmentally induced phase disturbances. In this contribution we present the TWI in a new robust common-path (Fizeau) configuration. The implementation of the Tilted Wave Fizeau Interferometer requires a new approach in illumination, calibration and evaluation. Measurements of two aspheres and a freeform surface show the flexibility and also the increased stability in both phase raw data and surface measurements, which leads to a reduced repeatability up to a factor of three. The novel configuration significantly relaxes the tolerances of the imaging optics used in the interferometer. We demonstrate this using simulations on calibration measurements, where we see an improvement of one order of magnitude compared to the classical Twyman-Green TWI approach and the capability to compensate higher order error contributions on the used optics.

Ultimate measurement speed for flexible asphere and freeform metrology: TWISS

“…The optical scheme of a common-path realization of the tilted wave interferometer in Fizeau configuration 10,11 is shown in figure 1. Here the reference wavefront is generated on the last surface of the interferometer objective, the so called Fizeau surface (highlighted in red).…”

“…Figure1. Optical layout of the Fizeau-Tilted-Wave-Interferometer 11. The surface generating the reference wave is highlighted in red.…”

Design of a Large Field of View and Low-Distortion Off-Axis Optical System Based on a Free-Form Surface

“…The free-form surface is widely used in panoramic optical systems, head-mounted displays, and off-axis reflective optical systems [15][16][17]. Free-form optics are optical surfaces with nonrotationally symmetric characteristics that can improve optical performance while enabling more novel features, reducing the size of rotationally asymmetric optical systems, and correcting system aberrations [18][19][20]. To date, the main parametric representations for optical free-form design include X-Y polynomials, Zernike polynomials, Q-polynomials, radial basis functions, and spline functions [21].…”