1982
DOI: 10.1002/pssa.2210700121
|View full text |Cite
|
Sign up to set email alerts
|

Time dependence of degradation in ZnO varistors

Abstract: Starting from the results of a previous paper on the functional relationship of the degradation of ZnO‐varistors and the influence factors (especially U, I,T) an equation system is derived to describe the time‐dependence of the degradation. The solutions including the contribution of degradation‐, recovery‐ and increasing effects of currents and temperature are given and discussed by special cases concerning the extent of the self‐heating and the electric operation conditions in certain approximations. Their v… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
3
0

Year Published

1982
1982
2003
2003

Publication Types

Select...
5

Relationship

2
3

Authors

Journals

citations
Cited by 5 publications
(3 citation statements)
references
References 7 publications
0
3
0
Order By: Relevance
“…Aging by electrical current is opposed by a recovery term, being dependent on degradation. This recovery term can very rapidly lead to saturation in the case of higher degradation rates (at constant temperature) [8].…”
Section: Discussionmentioning
confidence: 99%
“…Aging by electrical current is opposed by a recovery term, being dependent on degradation. This recovery term can very rapidly lead to saturation in the case of higher degradation rates (at constant temperature) [8].…”
Section: Discussionmentioning
confidence: 99%
“…How to control or reduce the long-term degradation effect remains one of the major challenges for the investigators. In general, the degradation [1][2][3][4][5][6][7][8] refers to a gradual increase (steady or slow) in leakage current under the electric pulse stress or constant applied voltage. Many early investigators [9][10][11][12] had recommended some remedial steps such as heat-treatment (annealing) in conjunction with the adjustment in the varistor formulation and processing variables to control the degradation process for better stability of the device under applications.…”
Section: Introductionmentioning
confidence: 99%
“…That is why Eqs. (4) and (5) show different formats. It is assumed that the degradation mechanisms of the normal method and pressurised vapour method are identical.…”
mentioning
confidence: 99%