EPJ Web of Conferences
 2013
DOI: 10.1051/epjconf/20134108016
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Time Domain Characterization of Light Trapping States in Thin Film Solar Cells

M. Birlo
1
,
Dominik Differt
2
,
Florian Lükermann
3
et al.

Abstract: Abstract. Spectral interferometry of the backscattered radiation reveals coherence lifetimes of about 150 fs for nanolocalized electromagnetic modes in textured layered nanostructures as they are commonly used in thin film photovoltaics to achieve high cell efficiencies.

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