2013
DOI: 10.1063/1.4837661
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Tin induced a-Si crystallization in thin films of Si-Sn alloys

Abstract: Effects of tin doping on crystallization of amorphous silicon were studied using Raman scattering, Auger spectroscopy, scanning electron microscopy, and X-ray fluorescence techniques. Formation of silicon nanocrystals (2–4 nm in size) in the amorphous matrix of Si1−xSnx, obtained by physical vapor deposition of the components in vacuum, was observed at temperatures around 300 °C. The aggregate volume of nanocrystals in the deposited film of Si1−xSnx exceeded 60% of the total film volume and correlated well wit… Show more

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Cited by 29 publications
(62 citation statements)
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“…5, the threshold of structural state change occurs in the region of intensity near 10 4 W/cm 2 , that is, at the intensity 5 times lower than that used in Fig. 9), the estimated temperature will be 300 + 40·8 = 620 K ~ 350 °С, which is consistent with the data of previous studies on the tin induced crystallization of amorphous silicon [20,21].…”
Section: Investigation Of the Laser Pulse (λ = 535 Nm T P = 10 Ns) Isupporting
confidence: 80%
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“…5, the threshold of structural state change occurs in the region of intensity near 10 4 W/cm 2 , that is, at the intensity 5 times lower than that used in Fig. 9), the estimated temperature will be 300 + 40·8 = 620 K ~ 350 °С, which is consistent with the data of previous studies on the tin induced crystallization of amorphous silicon [20,21].…”
Section: Investigation Of the Laser Pulse (λ = 535 Nm T P = 10 Ns) Isupporting
confidence: 80%
“…In particular, the possibility to form Si nanocrystals in amorphous Si matrix at 2 to 5 nm sizes and the phase volume fraction up to 80% was shown by means of tin-stimulated crystallization of amorphous Si at low temperatures [18][19][20]. These experimental results interpreted by the new MIC mechanism proposed in the papers [20][21][22].…”
Section: Introductionsupporting
confidence: 57%
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