2008
DOI: 10.1109/tdsc.2007.70235
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Toward Increasing FPGA Lifetime

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Cited by 80 publications
(34 citation statements)
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“…Many techniques have been explored to maximize lifetime in the presence of circuit aging with the aim of increasing period prior to initial failure [4], [6], [21]. For example in [6], different ASIC parameters such as supply voltage, operating clock frequency and cooling power are tuned using optimization algorithms to achieve power efficiency over lifetime as compared to traditional approach of incorporating worst case delays.…”
Section: Related Workmentioning
confidence: 99%
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“…Many techniques have been explored to maximize lifetime in the presence of circuit aging with the aim of increasing period prior to initial failure [4], [6], [21]. For example in [6], different ASIC parameters such as supply voltage, operating clock frequency and cooling power are tuned using optimization algorithms to achieve power efficiency over lifetime as compared to traditional approach of incorporating worst case delays.…”
Section: Related Workmentioning
confidence: 99%
“…In other efforts for FPGAs, the in-field reconfigurability and uniformity of available resources is exploited. For example, [4] employs periodic replacement of same configuration and rerouting interconnects with high switching activities (based on design-time estimates) so as to age components of FPGA in a uniform manner. Similarly, wear-leveling strategies for FPGAs such as alternative placements to form multiple configurations at design-time are introduced in [21].…”
Section: Related Workmentioning
confidence: 99%
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“…Researchers have proposed various techniques to exploit such flexibility in FPGAs [1][2][3]. This paper focuses on aginginduced delay degradation in FPGA logic and routing resources and presents a physical planning and reconfiguration scheme to reduce aging-rate and delay degradation in FPGA resources.…”
Section: Introductionmentioning
confidence: 99%
“…Srinivasan [5] gives an impact analysis of two different types of hard errors on FPGAs and a study of the performance degradation of FPGAs over time caused by HCI and NBTI. An experimental analysis is made to identify the main parameters and phenomena influencing the performance degradation of FPGAs has been presented in [6].…”
Section: Introductionmentioning
confidence: 99%