Towards a full retrieval of the deformation tensor F using convergent beam electron diffraction

Martin, Yannick; Zuo, Jian‐Min; Favre‐Nicolin, V.

doi:10.1016/j.ultramic.2014.12.009

Cited by 8 publications

(4 citation statements)

References 27 publications

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“…126 Concerning EBSDbased lattice parameter measurements in the SEM, it is not unreasonable to expect that it will be hard to surpass current limits which have been achieved under much better controlled conditions in the TEM, where minimum errors in the range of ×10 −4 to ×10 −3 have been estimated. [127][128][129][130][131][132][133] We have seen that the appearance of excess-deficiency features leads to intensity asymmetries in experimental Kikuchi diffraction patterns which are mainly governed by the asymmetry of the experimental setup, and not by any asymmetries of the observed crystal structure. The recently proposed automated detection of space groups from experimental Kikuchi patterns using machine learning approaches 134,135 relies on the assumed ability to discriminate the specific asymmetries between possible crystal structures based on correspondingly specific asymmetries in Kikuchi patterns.…”

Section: Discussionmentioning

confidence: 85%

“…Optical distortions will be an additional source of error that would need to be treated in high‐resolution pattern matching studies 126 . Concerning EBSD‐based lattice parameter measurements in the SEM, it is not unreasonable to expect that it will be hard to surpass current limits which have been achieved under much better controlled conditions in the TEM, where minimum errors in the range of

\times 10^{- 4}

\times 10^{- 3}

have been estimated 127–133 …”

Section: Discussionmentioning

confidence: 99%

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Kikuchi pattern simulations of backscattered and transmitted electrons

Winkelmann

Nolze

Cios

et al. 2021

Journal of Microscopy

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We discuss a refined simulation approach which treats Kikuchi diffraction patterns in electron backscatter diffraction (EBSD) and transmission Kikuchi diffraction (TKD). The model considers the result of two combined mechanisms: (a) the dynamical diffraction of electrons emitted coherently from point sources in a crystal and (b) diffraction effects on incoherent diffuse intensity distributions. Using suitable parameter settings, the refined simulation model allows to reproduce various thickness‐ and energy‐dependent features which are observed in experimental Kikuchi diffraction patterns. Excess‐deficiency features are treated by the effect of gradients in the incoherent background intensity. Based on the analytical two‐beam approximation to dynamical electron diffraction, a phenomenological model of excess‐deficiency features is derived, which can be used for pattern matching applications. The model allows to approximate the effect of the incident beam geometry as a correction signal for template patterns which can be reprojected from pre‐calculated reference data. As an application, we find that the accuracy of fitted projection centre coordinates in EBSD and TKD can be affected by changes in the order of 10−3–10−2 if excess‐deficiency features are not considered in the theoretical model underlying a best‐fit pattern matching approach. Correspondingly, the absolute accuracy of simulation‐based EBSD strain determination can suffer from biases of a similar order of magnitude if excess‐deficiency effects are neglected in the simulation model.

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Section: Discussionmentioning

confidence: 85%

\times 10^{- 4}

\times 10^{- 3}

have been estimated 127–133 …”

Section: Discussionmentioning

confidence: 99%

Kikuchi pattern simulations of backscattered and transmitted electrons

Winkelmann

Nolze

Cios

et al. 2021

Journal of Microscopy

View full text Add to dashboard Cite

show abstract

“…The orientation information provided by this technique is complementary to the lateral components of the strain tensor and can be used to supplement information obtained by other two-dimensional [17,[34][35][36] or three-dimensional [37][38][39] strain mapping techniques. …”

Section: Discussionmentioning

confidence: 99%

Two-dimensional misorientation mapping by rocking dark-field transmission electron microscopy

2015

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“…Note that all 9 components of D can be determined by measuring the multiple excess and deficit lines at different tilting angles, in principle. 21 We determined D xx , D yy , D zx , D zy as we scanned the beam position and the delay time ( x , y , t ), by recording the positions of the excess (deficit) lines obtained from the local maxima (minima) of 8̄00 and 080 diffraction intensities.…”

Section: Methodsmentioning

confidence: 99%