A 1200-V/100-mΩ GaN/SiC cascode device is demonstrated with small capacitances for fast switching speed, no dynamic ON-resistance (RON) degradation, and stable high-temperature threshold voltage (VTH). To identify its safe operation in the OFF-state with a high drain bias, the middle point voltage (VM) between the GaN and SiC devices is investigated under static and dynamic modes. An adequately low VM is achieved at both static and dynamic states. A voltage distribution process found that the OFF-state VM is capacitance-dependent during the turn-off transient and turns to be resistance-dependent to match the leakage current with a steady drain bias.