Transient current testing of 0.25 μm CMOS devices

Efficient test strategy for TDMA power amplifiers using transient current measurements: uses and benefits

“…While tests like Iddq, Iddt remain common to digital systems, there is little [5] or no application of this concept to analog circuits. In this work, the proposed algorithm uses transient current behavior to test RF circuits.…”

New ATPG algorithm for i/sub DDT/-based testing

“…Consequently, more effective techniques are being investigated and proposed by researchers. Among these techniques are: Delta-I DDQ testing [2]- [6] and Dynamic Current Testing [7]- [15]. In section 2 we describe the conditions for an ATPG that is to be used for i DDT -based test methods, then in section 3 we discuss a new ATPG algorithm that generates vector pairs for the i DDT -based testing methods.…”

A BIST-based charge analysis for embedded memories

“…Several techniques based on this approach were proposed when quiescent current methods (IDDQbased techniques) became less effective due to increase of both leakage and parameter variations in deep submicron ICs. These techniques include current shape analysis [1], measurement of the transient current at a given time [2], combination of time and frequency-domain analysis [3], measurement of the average energy consumption ratios [4], power and ground supply pulsing [5], transient V dd analysis [6], and charge based transient current testing [7]. Some of these methods are demonstrating its effectiveness in specific designed prototyping experiments and/or medium sized circuits, while its application to real environments in production or field-testing is more limited.…”

“…The experiments reported in [8,9] showed the potentials of idd(t) to detect devices that passed I DDQ or logic testing using off-chip measurement techniques.…”