Transient current testing of dynamic CMOS circuits

Aaraj, Najwa; Nazer, A.; Chehab, Ali; Kayssi, Ayman

doi:10.1109/dftvs.2004.1347848

Cited by 3 publications

(1 citation statement)

References 17 publications

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“…Previous results showed a high rate of defect detection using iDDT in relatively small CMOS domino circuits [14]. In this paper we apply iDDT testing to larger CMOS domino logic circuits.…”

Section: Introductionmentioning

confidence: 97%

Dynamic Current Testing for CMOS Domino Circuits

Nazer

Chehab

Kayssi

2006

2006 49th IEEE International Midwest Symposium on Circuits and Systems

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In this paper, we propose a method for testing domino CMOS circuits using the transient power supply current. The method is based on monitoring the peak value of the transient current. We also present a test vector generation algorithm for testing large domino circuits. We evaluate the effectiveness of this testing method through simulations of various domino circuits of different sizes. Furthermore, we develop and implement a clustering technique to improve the fault coverage of the test method when used with large circuits. The algorithm divides the circuit into different clusters where each cluster is fed by a different power supply branch.

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“…Previous results showed a high rate of defect detection using iDDT in relatively small CMOS domino circuits [14]. In this paper we apply iDDT testing to larger CMOS domino logic circuits.…”

Section: Introductionmentioning

confidence: 97%