2008
DOI: 10.1017/s1431927608089204
|View full text |Cite
|
Sign up to set email alerts
|

Transmission electron microscopy analysis of the interfaces of TiAlN/Mo multilayers

Abstract: This paper focus on the analysis of the interfaces of nanocomposite TiAlN/Mo multilayers by high-resolution transmission electron microscopy (HRTEM). These thin films were deposited by reactive magnetron sputtering, with modulation periods below 7 nm. The structural disorder at the interfaces was probed by the analysis of the X-ray diffraction data, and afterwards correlated with the TEM observations on the cross-sections of the TiAlN/Mo multilayers. For specific deposition conditions, these structures can be … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2009
2009
2014
2014

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 6 publications
0
2
0
Order By: Relevance
“…This increased hardness effect has been observed for many other nitride/nitride multilayer systems [6,7], but also for nitride/metal systems, where the materials have different crystal structures [8,9]. Figure 24.3 shows an example of the dependence of the hardness on the modulation period for TiAlN/Mo multilayers.…”
Section: Multilayers With Nanometric Periodmentioning
confidence: 68%
See 1 more Smart Citation
“…This increased hardness effect has been observed for many other nitride/nitride multilayer systems [6,7], but also for nitride/metal systems, where the materials have different crystal structures [8,9]. Figure 24.3 shows an example of the dependence of the hardness on the modulation period for TiAlN/Mo multilayers.…”
Section: Multilayers With Nanometric Periodmentioning
confidence: 68%
“…It is easy to see why interface effects dominate the structure and properties of nanostructured coatings. The Hardness as a function of the modulation Λ for Ti0.4Al0.6N/Mo multilayers comprising 250 bilayers, fabricated by magnetron sputtering with substrate bias −100 V. For Λc ≥ 4 nm, the continuous curve represents the fitting to a HallPetch law [9]: H = H0 + kΛ −p , where k is a constant reflecting the effect of interface hardening and p is an exponent in the range 0.3-0.7 most important parameter controlling the increase in hardness of the stack in an A/B/A/B. .…”
Section: Multilayers With Nanometric Periodmentioning
confidence: 99%