2013
DOI: 10.1007/978-3-642-29761-8
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Transmission Electron Microscopy and Diffractometry of Materials

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Cited by 283 publications
(180 citation statements)
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“…[119] Small differences are much more difficult to detect (Co and Ni). Initial experiments that retrieved more than a single density measurement per voxel involved spectroscopic methods such as EELS [120] and X-ray energy-dispersive spectroscopy (X-EDS) [121] in TEM or STEM mode. Both spectroscopic methods are very powerful for measuring elemental distributions at the nanometer scale, producing signals that conform to projection theorems.…”
Section: Advances In Et For Physical-sciences Researchmentioning
confidence: 99%
“…[119] Small differences are much more difficult to detect (Co and Ni). Initial experiments that retrieved more than a single density measurement per voxel involved spectroscopic methods such as EELS [120] and X-ray energy-dispersive spectroscopy (X-EDS) [121] in TEM or STEM mode. Both spectroscopic methods are very powerful for measuring elemental distributions at the nanometer scale, producing signals that conform to projection theorems.…”
Section: Advances In Et For Physical-sciences Researchmentioning
confidence: 99%
“…This phenomenon materializes as asymmetry in the intensity profile of a K-band and makes one side of the K-band appear brighter than the other side (Williams & Carter, 2009;Fultz & Howe, 2008;Winkelmann, 2008Winkelmann, , 2009). The classical 2D WHTbased plane trace localization algorithm does not account for asymmetry; therefore, we expect the plane trace localization error, and consequently the orientation error, for real patterns to be larger than what is reported in this study.…”
Section: Figurementioning
confidence: 99%
“…where t is the averaged dimension (size) of the crystallite or the length of the column of coherently diffracting plane in the crystallite (Fultz and Howe, 2007), K is the crystallite shape constant that may depend on the specific geometry of the scattering objects, k is the wavelength of the X-ray source, h is the Bragg diffraction angle in degrees and B is the diffraction peak width proportional to FWHM located at 2h. That formula provides a crystallite size from the measured FWHM of one diffraction peak (Guinier, 1994).…”
Section: Theoretical Considerations Of X-ray Diffractometermentioning
confidence: 99%