2010
DOI: 10.1088/0268-1242/25/2/024015
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Transport characterization in nanowires using an electrical nanoprobe

Abstract: Electrical transport in semiconductor nanowires is commonly measured in a field effect transistor configuration, with lithographically defined source, drain, and in some cases, top gate electrodes. This approach is labor intensive, requires high-end fabrication equipment, exposes the nanowires to extensive processing chemistry, and places practical limitations on minimum nanowire length. Here we describe a simple method for characterizing electrical transport in nanowires directly on the growth substrate, with… Show more

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Cited by 62 publications
(65 citation statements)
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“…This result indicates the existence of an additional charging/discharging current flowing on increase/decrease of the voltage. The non-linear behaviour is consistent with previous reports on different materials, such as ZnO, GaN or InAs, in which it was associated to space-charged-limited current (SCLC) [24][25][26]. The SCLC suggests the existence of two conduction regimens.…”
Section: Resultssupporting
confidence: 90%
“…This result indicates the existence of an additional charging/discharging current flowing on increase/decrease of the voltage. The non-linear behaviour is consistent with previous reports on different materials, such as ZnO, GaN or InAs, in which it was associated to space-charged-limited current (SCLC) [24][25][26]. The SCLC suggests the existence of two conduction regimens.…”
Section: Resultssupporting
confidence: 90%
“…Series B NWs with different doping profiles (fully n-type, half-way-doped n-type and nominally undoped) were characterized with I-V measurements using STM 33 . Several NWs of the same type were characterized in this way.…”
Section: Methodsmentioning
confidence: 99%
“…By controllably inducing failure by Joule heating, we show that electrical transport is dominated by the bulk of the NW instead of the contacts, a further indication of SCL transport. The two-point probe method we employ [7] is performed in-vacuo on freestanding wires thus diminishing the electrical and thermal influence of molecular adsorbates and the substrate on which NW devices typically lie.…”
mentioning
confidence: 99%